Research Output 1994 2019

Filter
Conference contribution
2018

Schottky Barrier Height Quantification of Plasma Treated P(VDF-TRFE) Thin Films

Vecchio, M., Barhoumi Ep Meddeb, A., Ounaies, Z., Lanagan, M. T. & Shallenberger, J., Nov 26 2018, 2018 IEEE CEIDP Conference on Electrical Insulation and Dielectric Phenomena, CEIDP 2018. Institute of Electrical and Electronics Engineers Inc., p. 9-13 5 p. 8544868. (Annual Report - Conference on Electrical Insulation and Dielectric Phenomena, CEIDP; vol. 2018-October).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Chemical modification
Plasmas
Thin films
Secondary ion mass spectrometry
Surface chemistry
2016

Effect of cooling rate on the crystal polymorphism in beta-nucleated isotactic polypropylene as revealed by a combined WAXS/FSC analysis

Rhoades, A. M., Wonderling, N. M., Gohn, A. M., Williams, J., Mileva, D., Gahleitner, M. & Androsch, R., May 18 2016, VIII International Conference on "Times of Polymers and Composites": From Aerospace to Nanotechnology. D'Amore, A., Grassia, L. & Acierno, D. (eds.). American Institute of Physics Inc., 4949651. (AIP Conference Proceedings; vol. 1736).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

polymorphism
polypropylene
heat measurement
chips
cooling
2015
2 Citations (Scopus)

Vacuum assisted ex situ Lift Out for Manipulation of FIB prepared specimens

Giannuzzi, L. A., Hess, D. & Clark, T. E., Jan 1 2015, ISTFA 2015 - Conference Proceedings from the 41st International Symposium for Testing and Failure Analysis. ASM International, p. 61-64 4 p. (Conference Proceedings from the International Symposium for Testing and Failure Analysis; vol. 2015-January).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Vacuum
2014

Nano-scale chemistry of complex self-assembled nanostructures in epitaxial sige films

Balasubramanian, P., Floro, J. A., Gray, J. L. & Hull, R., Jan 1 2014, Nanostructured Semiconductors and Nanotechnology. Materials Research Society, p. 75-80 6 p. (Materials Research Society Symposium Proceedings; vol. 1551).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Nanostructures
Auger electron spectroscopy
chemistry
Auger spectroscopy
electron spectroscopy
2013

Surface and interface characterization of polymer films

Shallenberger, J., 2013, Web Coating and Handling Conference 2013. Association of International Metallizers, Coaters and Laminators, Vol. 2. p. 1274-1303 30 p.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Polymer films
polymers
Photoelectron spectroscopy
Secondary ion mass spectrometry
x ray spectroscopy
2010
1 Citation (Scopus)

Fabrication of Ga-tcmplatcs using a focused ion beam

Wang, H., Hartman, G. C., Williams, J. & Gray, J. L., Oct 15 2010, Nanoscale Pattern Formation. Vol. 1228. p. 54-59 6 p.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Focused ion beams
templates
ion beams
Fabrication
fabrication

Growth of carbon nanotubes on copper substrates using a nickel thin film catalyst

Atthipalli, G., Kumta, P. N., Wang, W., Epur, R., Jampani, P. H., Allen, B. L., Tang, Y., Star, A. & Gray, J. L., Aug 30 2010, Nanotubes and Related Nanostructures - 2009. p. 55-60 6 p. (Materials Research Society Symposium Proceedings; vol. 1204).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Carbon Nanotubes
Nickel
Copper
Carbon nanotubes
carbon nanotubes
2009

Growth mechanisms and size-dependent characteristics of Si and Si 1-xGex nanowires

Redwing, J. M., Nimmatoori, P., Lew, K. K., Zhang, X., Zhang, Q., Clark, T. E., Pan, L. & Dickey, E. C., Dec 1 2009, ECS Transactions - EuroCVD 17/CVD 17. 8 PART 2 ed. Vol. 25. p. 1145-1152 8 p.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Nanowires
Chemical vapor deposition
Electronic equipment
Vapors
Catalysts
2003

Reversing of silicon surface aging by lamp cleaning

Shanmugasundaram, K., Chang, K., Shallenberger, J., Danel, A., Tardif, F., Veillerot, M. & Ruzyllo, J., 2003, Cleaning Technology in Semiconductor Device Manufacturing VIII - Proceedings of the International Symposium. Ruzyllo, J., Hattori, T., Opila, R. L. & Novak, R. E. (eds.). Vol. 26. p. 348-355 8 p.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Electric lamps
Cleaning
Aging of materials
Silicon
Infrared lamps
1999
13 Citations (Scopus)

Oxide thickness determination by XPS, AES, SIMS, RBS and TEM

Shallenberger, J., Cole, D. A., Novak, S. W., Moore, R. L., Edgell, M. J., Smith, S. P., Hitzman, C. J., Kirchhoff, J. F., Principe, E., Biswas, S., Bleiler, R. J., Nieveen, W. & Jones, K., Dec 1 1999, Proceedings of the International Conference on Ion Implantation Technology. IEEE, p. 79-82 4 p. (Proceedings of the International Conference on Ion Implantation Technology; vol. 1).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Rutherford backscattering spectroscopy
Auger electron spectroscopy
Secondary ion mass spectrometry
X ray photoelectron spectroscopy
Transmission electron microscopy
3 Citations (Scopus)

Recent advances in XPS characterization of ultra-thin oxides

Shallenberger, J., Cole, D. A., Downey, D. F., Falk, S. & Zhao, Z., Dec 1 1999, Proceedings of the International Conference on Ion Implantation Technology. IEEE, p. 566-569 4 p. (Proceedings of the International Conference on Ion Implantation Technology; vol. 1).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

X ray photoelectron spectroscopy
Oxides
Thickness measurement
Ions
Oxidation