Research Output 1994 2019

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Paper
2005
2 Citations (Scopus)

Characteristics of Hf(Si,O) gate dielectrics as a function of HF content

Chang, K., Shallenberger, J., Chang, F. M., Shanmugasundaram, K., Roman, P., Mumbauer, P. & Ruzyllo, J., Dec 1 2005, p. 404-410. 7 p.

Research output: Contribution to conferencePaper

Gate dielectrics
Charge trapping
Fog
Permittivity
Liquids

Electrocatalytic oxidation of methanol on high surface area unsupported catalysts

Jambunathan, K., Liu, R., Pan, L., Dickey, E., Shallenberger, J., Smotkin, E. & Mallouk, T. E., Dec 13 2005, p. 108-120. 13 p.

Research output: Contribution to conferencePaper

Methanol
Oxidation
Catalysts
Electrocatalysts
Alloying
2003
2 Citations (Scopus)

Study of the effect of silicon surface treatment on equivalent oxide thickness in high-k dielectric mos gate stacks

Chang, K., Shanmugasundaram, K., Lee, D. O., Roman, P., Shallenberger, J., Chang, F. M., Wang, J., Mumbauer, P., Grant, R., Beck, R. & Ruzyllo, J., Dec 1 2003, p. 78-85. 8 p.

Research output: Contribution to conferencePaper

Surface treatment
Silicon
Oxides
Nitrogen plasma
Gate dielectrics