• 1587 Citations
  • 24 h-Index
1993 …2019
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Research Output 1993 2019

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Conference contribution
2012
2 Citations (Scopus)

Sodium, rubidium and cesium in the gate oxides of SiC MOSFETs

Tuttle, B. R., Dhar, S., Ryu, S. H., Zhu, X., Williams, J. R., Feldman, L. C. & Pantelides, S. T., May 28 2012, Silicon Carbide and Related Materials 2011, ICSCRM 2011. p. 453-456 4 p. (Materials Science Forum; vol. 717-720).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Rubidium
Cesium
rubidium
cesium
Oxides
2011
1 Citation (Scopus)

Radiation-induced oxide charge in low- and high-H 2 environments

Rowsey, N. L., Law, M. E., Schrimpf, R. D., Fleetwood, D. M., Tuttle, B. R. & Pantelides, S. T., 2011, RADECS 2011 - 12th European Conference on Radiation and Its Effects on Component and Systems, Conference Proceedings. p. 51-53 3 p. 6131384

Research output: Chapter in Book/Report/Conference proceedingConference contribution

trapping
electronic structure
Radiation
Hydrogen
irradiation
2009

Performance, reliability, radiation effects, and aging issues in microelectronics - From atomic-scale physics to engineering-level modeling

Pantelides, S. T., Tsetseris, L., Beck, M. J., Rashkeev, S. N., Hadjisavvas, G., Batyrev, I. G., Tuttle, B. R., Marinopoulos, A. G., Zhou, X. J., Fleetwood, D. M. & Schrimpf, R. D., Dec 1 2009, ESSCIRC 2009 - Proceedings of the 35th European Solid-State Circuits Conference. p. 76-83 8 p. 5325931. (ESSCIRC 2009 - Proceedings of the 35th European Solid-State Circuits Conference).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Radiation effects
Microelectronics
Physics
Aging of materials
Electron mobility
3 Citations (Scopus)

Performance, reliability, radiation effects, and aging issues in microelectronics - From atomic-scale physics to engineering-level modeling

Pantelides, S. T., Tsetseris, L., Beck, M. J., Rashkeev, S. N., Hadjisavvas, G., Batyrev, I. G., Tuttle, B. R., Marinopoulos, A. G., Zhou, X. J., Fleetwood, D. M. & Schrimpf, R. D., Dec 1 2009, ESSDERC 2009 - Proceedings of the 39th European Solid-State Device Research Conference. p. 48-55 8 p. 5331355. (ESSDERC 2009 - Proceedings of the 39th European Solid-State Device Research Conference).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

microelectronics
Radiation effects
Microelectronics
physics
Physics

Performance, reliability, radiation effects, and aging issues in microelectronics - From atomic-scale physics to engineering-level modeling

Pantelides, S. T., Tsetseris, L., Beck, M. J., Rashkeev, S. N., Hadjisawas, G., Batyrev, I., Tuttle, B., Marinopoulos, A. G., Zhou, X. J., Fleetwood, D. M. & Schrimpf, R. D., Dec 1 2009, Silicon Nitride, Silicon Dioxide, and Emerging Dielectrics 10. 2 ed. p. 319-337 19 p. (ECS Transactions; vol. 19, no. 2).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Radiation effects
Microelectronics
Physics
Aging of materials
Electron mobility