• 1852 Citations
  • 23 h-Index
1990 …2019
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Fingerprint Dive into the research topics where David W. Snyder is active. These topic labels come from the works of this person. Together they form a unique fingerprint.

Engineering & Materials Science

Graphene
Chemical vapor deposition
Substrates
Silicon carbide
Boron nitride
Crystals
Single crystals
Boron
Polishing
Temperature
Cadmium telluride
Seed
Vapors
Semiconductor lasers
Physical vapor deposition
Transistors
Hydrogen
Silicon
Pyrolysis
Carrier mobility
Growth temperature
Epilayers
Metallorganic chemical vapor deposition
Growth kinetics
Surface roughness
Temperature measurement
Thin films
Oxides
Gases
Electronic properties
Pulsed lasers
Metals
Wavelength
Electronic equipment
Nucleation
Sensors
Graphite
Gate dielectrics
Sapphire
Field effect transistors
Copper
Diffusion barriers
Buffer layers
Superconducting films
Atoms
Atomic layer deposition
Defects
Carbon
Nitrogen
Deposition rates

Physics & Astronomy

Engineering

graphene
transistors
polishing
carrier mobility
tensile stress
electrical resistivity
nucleation
semiconductor lasers
electron mobility
contact resistance

General

vapor deposition
wafers
boules
piezoelectric crystals
crystals
single crystals
reactors
metalorganic chemical vapor deposition
seeds
reactor design
purity
electronics
inclination
thin films
buffers
pulsed lasers
thermodynamic equilibrium
impurities
transmission electron microscopy

Chemistry and Materials

halides
silicon carbides
boron
boron nitrides
vapors
cadmium tellurides
vapor phase epitaxy
hydrogen
thermal decomposition
surface roughness
nitrogen
silicon
oxides
graphite
silicon tetrachloride
gallium oxides
atomic layer epitaxy

Physics

temperature
atoms
room temperature

Aerospace Sciences

cavities

Chemical Compounds

Graphite
Chemical vapor deposition
Substrates
Boron
Crystals
Hydrogen
Polishing
Seed
Vapors
Silicon
Physical vapor deposition
Gases
Metals
Single crystals
Pyrolysis
Growth temperature
Epilayers
Metallorganic chemical vapor deposition
Growth kinetics
Oxides
Carrier mobility
Transistors
Surface roughness
Thin films
Temperature
Copper
Aluminum Oxide
Carbon
Nucleation
Electronic equipment
Gate dielectrics
Nitrogen
Diffusion barriers
Buffer layers
Superconducting films
Atoms
Atomic layer deposition
Organic Chemicals
Deposition rates
Tensile stress
Field effect transistors
Scattering
Bromine
Experimental reactors
Edge dislocations
Organometallics
Screw dislocations
Helium
Transport properties
Tellurium