Jeffrey Shallenberger

    • 357 Citations
    • 8 h-Index
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    Fingerprint Dive into the research topics where Jeffrey Shallenberger is active. These topic labels come from the works of this person. Together they form a unique fingerprint.

    • 1 Similar Profiles
    X ray photoelectron spectroscopy Engineering & Materials Science
    x ray spectroscopy Physics & Astronomy
    photoelectron spectroscopy Physics & Astronomy
    Photoelectron spectroscopy Engineering & Materials Science
    X rays Engineering & Materials Science
    Secondary ion mass spectrometry Engineering & Materials Science
    Silicon Chemical Compounds
    Oxides Engineering & Materials Science

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    Research Output 1996 2019

    • 357 Citations
    • 8 h-Index
    • 15 Article
    • 4 Conference contribution
    • 4 Paper
    • 1 Conference article

    2D bismuth telluride analyzed by XPS

    Shallenberger, J. R., Smyth, C. M., Addou, R. & Wallace, R. M., Dec 1 2019, In : Surface Science Spectra. 26, 2, 024011.

    Research output: Contribution to journalArticle

    bismuth tellurides
    x ray fluorescence
    inductively coupled plasma mass spectrometry
    2 Citations (Scopus)

    Chemistry of Singlet Oxygen with a Cadmium-Sulfur Cluster: Physical Quenching versus Photooxidation

    Cagan, D. A., Garcia, A. C., Li, K., Ashen-Garry, D., Tadle, A. C., Zhang, D., Nelms, K. J., Liu, Y., Shallenberger, J., Stapleton, J. J. & Selke, M., Jan 9 2019, In : Journal of the American Chemical Society. 141, 1, p. 67-71 5 p.

    Research output: Contribution to journalArticle

    Singlet Oxygen

    2D tungsten diselenide analyzed by XPS

    Shallenberger, J., Jun 1 2018, In : Surface Science Spectra. 25, 1, 014001.

    Research output: Contribution to journalArticle

    x ray fluorescence
    x ray spectroscopy
    1 Citation (Scopus)

    Schottky Barrier Height Quantification of Plasma Treated P(VDF-TRFE) Thin Films

    Vecchio, M., Barhoumi Ep Meddeb, A., Ounaies, Z., Lanagan, M. T. & Shallenberger, J., Nov 26 2018, 2018 IEEE CEIDP Conference on Electrical Insulation and Dielectric Phenomena, CEIDP 2018. Institute of Electrical and Electronics Engineers Inc., p. 9-13 5 p. 8544868. (Annual Report - Conference on Electrical Insulation and Dielectric Phenomena, CEIDP; vol. 2018-October).

    Research output: Chapter in Book/Report/Conference proceedingConference contribution

    Chemical modification
    Thin films
    Secondary ion mass spectrometry
    Surface chemistry