Jeffrey Shallenberger

    • 368 Citations
    • 8 h-Index
    19962020

    Research output per year

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    Research Output

    2020

    Atomically thin half-van der Waals metals enabled by confinement heteroepitaxy

    Briggs, N., Bersch, B., Wang, Y., Jiang, J., Koch, R. J., Nayir, N., Wang, K., Kolmer, M., Ko, W., De La Fuente Duran, A., Subramanian, S., Dong, C., Shallenberger, J., Fu, M., Zou, Q., Chuang, Y. W., Gai, Z., Li, A. P., Bostwick, A., Jozwiak, C. & 6 others, Chang, C. Z., Rotenberg, E., Zhu, J., van Duin, A. C. T., Crespi, V. & Robinson, J. A., Jun 1 2020, In : Nature Materials. 19, 6, p. 637-643 7 p.

    Research output: Contribution to journalArticle

    1 Scopus citations

    Caveats in obtaining high-quality 2D materials and property characterization

    Subramanian, S., Briggs, N., Shallenberger, J., Wetherington, M. T. & Robinson, J. A., Apr 28 2020, In : Journal of Materials Research. 35, 8, p. 855-863 9 p.

    Research output: Contribution to journalReview article

    Open Access

    Simultaneous Reduction and Polymerization of Graphene Oxide/Styrene Mixtures to Create Polymer Nanocomposites with Tunable Dielectric Constants

    Hou, D., Bostwick, J. E., Shallenberger, J. R., Zofchak, E. S., Colby, R. H., Liu, Q. & Hickey, R. J., Feb 28 2020, In : ACS Applied Nano Materials. 3, 2, p. 962-968 7 p.

    Research output: Contribution to journalArticle

    Open Access
    1 Scopus citations
    Open Access
    2019

    2D bismuth telluride analyzed by XPS

    Shallenberger, J. R., Smyth, C. M., Addou, R. & Wallace, R. M., Dec 1 2019, In : Surface Science Spectra. 26, 2, 024011.

    Research output: Contribution to journalArticle

    2D topological insulator bismuth selenide analyzed by in situ XPS

    Wang, X., Smyth, C. M., Khosravi, A., Cormier, C. R., Shallenberger, J. R., Addou, R. & Wallace, R. M., Dec 1 2019, In : Surface Science Spectra. 26, 2, 024014.

    Research output: Contribution to journalArticle

    Chemistry of Singlet Oxygen with a Cadmium-Sulfur Cluster: Physical Quenching versus Photooxidation

    Cagan, D. A., Garcia, A. C., Li, K., Ashen-Garry, D., Tadle, A. C., Zhang, D., Nelms, K. J., Liu, Y., Shallenberger, J. R., Stapleton, J. J. & Selke, M., Jan 9 2019, In : Journal of the American Chemical Society. 141, 1, p. 67-71 5 p.

    Research output: Contribution to journalArticle

    2 Scopus citations
    2018

    2D tungsten diselenide analyzed by XPS

    Shallenberger, J. R., Jun 1 2018, In : Surface Science Spectra. 25, 1, 014001.

    Research output: Contribution to journalArticle

    3 Scopus citations
    1 Scopus citations

    Schottky Barrier Height Quantification of Plasma Treated P(VDF-TRFE) Thin Films

    Vecchio, M., Barhoumi Ep Meddeb, A., Ounaies, Z., Lanagan, M. T. & Shallenberger, J., Nov 26 2018, 2018 IEEE CEIDP Conference on Electrical Insulation and Dielectric Phenomena, CEIDP 2018. Institute of Electrical and Electronics Engineers Inc., p. 9-13 5 p. 8544868. (Annual Report - Conference on Electrical Insulation and Dielectric Phenomena, CEIDP; vol. 2018-October).

    Research output: Chapter in Book/Report/Conference proceedingConference contribution

    2017

    Performance stability of silicone oxide-coated plastic parenteral vials

    Weikart, C. M., Pantano, C. G. & Shallenberger, J., Jul 1 2017, In : PDA Journal of Pharmaceutical Science and Technology. 71, 4, p. 317-327 11 p.

    Research output: Contribution to journalArticle

    4 Scopus citations
    2013

    Analysis & materials characterization - Surface characterization of pharmaceuticals by x-ray photoelectron spectroscopy

    Shallenberger, J. & Lee, R. W., Jan 2013, Drug Delivery Technology, 13, 1.

    Research output: Contribution to specialist publicationArticle

    Surface and interface characterization of polymer films

    Shallenberger, J., 2013, Web Coating and Handling Conference 2013. Association of International Metallizers, Coaters and Laminators, Vol. 2. p. 1274-1303 30 p.

    Research output: Chapter in Book/Report/Conference proceedingConference contribution

    2007

    Studies of Hf(Si,O) dielectrics for metal-oxide-semiconductor applications

    Chang, K., Shanmugasundaram, K., Shallenberger, J. & Ruzyllo, J., Feb 26 2007, In : Thin Solid Films. 515, 7-8, p. 3802-3805 4 p.

    Research output: Contribution to journalArticle

    11 Scopus citations
    2006
    16 Scopus citations
    2005

    Characteristics of Hf(Si,O) gate dielectrics as a function of HF content

    Chang, K., Shallenberger, J., Chang, F. M., Shanmugasundaram, K., Roman, P., Mumbauer, P. & Ruzyllo, J., Dec 1 2005, p. 404-410. 7 p.

    Research output: Contribution to conferencePaper

    2 Scopus citations

    Electrocatalytic oxidation of methanol on high surface area unsupported catalysts

    Jambunathan, K., Liu, R., Pan, L., Dickey, E., Shallenberger, J., Smotkin, E. & Mallouk, T. E., Dec 13 2005, p. 108-120. 13 p.

    Research output: Contribution to conferencePaper

    2004

    Silicon surface treatments in advanced MOS gate processing

    Chang, K., Shanmugasundaram, K., Lee, D. O., Roman, P., Wu, C. T., Wang, J., Shallenberger, J., Mumbauer, P., Grant, R., Ridley, R., Dolny, G. & Ruzyllo, J., Apr 1 2004, In : Microelectronic Engineering. 72, 1-4, p. 130-135 6 p.

    Research output: Contribution to journalConference article

    2 Scopus citations
    2003

    Adsorption of polyamides and polyamide-silane mixtures at glass surfaces

    Shallenberger, J. R., Metwalli, E. E., Pantano, C. G., Tuller, F. N. & Fry, D. F., Aug 1 2003, In : Surface and Interface Analysis. 35, 8, p. 667-672 6 p.

    Research output: Contribution to journalArticle

    17 Scopus citations

    Reversing of silicon surface aging by lamp cleaning

    Shanmugasundaram, K., Chang, K., Shallenberger, J., Danel, A., Tardif, F., Veillerot, M. & Ruzyllo, J., Dec 1 2003, p. 348-355. 8 p.

    Research output: Contribution to conferencePaper

    Study of the effect of silicon surface treatment on equivalent oxide thickness in high-k dielectric mos gate stacks

    Chang, K., Shanmugasundaram, K., Lee, D. O., Roman, P., Shallenberger, J., Chang, F. M., Wang, J., Mumbauer, P., Grant, R., Beck, R. & Ruzyllo, J., Dec 1 2003, p. 78-85. 8 p.

    Research output: Contribution to conferencePaper

    2 Scopus citations
    2002

    Surface analysis of 24% lead crystal glass articles: Correlation with lead release

    Guadagnino, E., Verità, M., Geotti-Bianchini, F., Shallenberger, J. & Pantano, C. G., Apr 1 2002, In : Glass Technology. 43, 2, p. 63-69 7 p.

    Research output: Contribution to journalArticle

    7 Scopus citations
    2000

    SiO2 thickness determination by X-ray photoelectron spectroscopy, Auger electron spectroscopy, secondary ion mass spectrometry, Rutherford backscattering, transmission electron microscopy, and ellipsometry

    Cole, D. A., Shallenberger, J. R., Novak, S. W., Moore, R. L., Edgell, M. J., Smith, S. P., Hitzman, C. J., Kirchhoff, J. F., Principe, E., Nieveen, W., Huang, F. K., Biswas, S., Bleiler, R. J. & Jones, K., Jan 1 2000, In : Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures. 18, 1, p. 440-444 5 p.

    Research output: Contribution to journalArticle

    76 Scopus citations
    1999

    Characterization of silicon oxynitride thin films by x-ray photoelectron spectroscopy

    Shallenberger, J., Cole, D. A. & Novak, S. W., Jan 1 1999, In : Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films. 17, 4, p. 1086-1090 5 p.

    Research output: Contribution to journalArticle

    129 Scopus citations

    Effects of annealing on X-ray-amorphous CVD W-Si-N barrier layer materials

    Gokce, O. H., Amin, S., Ravindra, N. M., Szostak, D. J., Paff, R. J., Fleming, J. G., Galewski, C. J., Shallenberger, J. & Eby, R., Sep 29 1999, In : Thin Solid Films. 353, 1, p. 149-156 8 p.

    Research output: Contribution to journalArticle

    16 Scopus citations

    Oxide thickness determination by XPS, AES, SIMS, RBS and TEM

    Shallenberger, J. R., Cole, D. A., Novak, S. W., Moore, R. L., Edgell, M. J., Smith, S. P., Hitzman, C. J., Kirchhoff, J. F., Principe, E., Biswas, S., Bleiler, R. J., Nieveen, W. & Jones, K., Dec 1 1999, Proceedings of the International Conference on Ion Implantation Technology. IEEE, p. 79-82 4 p. (Proceedings of the International Conference on Ion Implantation Technology; vol. 1).

    Research output: Chapter in Book/Report/Conference proceedingConference contribution

    14 Scopus citations

    Recent advances in XPS characterization of ultra-thin oxides

    Shallenberger, J., Cole, D. A., Downey, D. F., Falk, S. & Zhao, Z., Dec 1 1999, Proceedings of the International Conference on Ion Implantation Technology. IEEE, p. 566-569 4 p. (Proceedings of the International Conference on Ion Implantation Technology; vol. 1).

    Research output: Chapter in Book/Report/Conference proceedingConference contribution

    3 Scopus citations

    Structure and bonding in nitrided oxide films by sims and XPS

    Novak, S. W., Shallenberger, J., Cole, D. A. & Marino, J. W., 1999, In : Materials Research Society Symposium - Proceedings. 567, p. 579-586 8 p.

    Research output: Contribution to journalArticle

    4 Scopus citations
    1996
    57 Scopus citations