Jeffrey Shallenberger

    • 368 Citations
    • 8 h-Index
    19962020

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    2018

    Schottky Barrier Height Quantification of Plasma Treated P(VDF-TRFE) Thin Films

    Vecchio, M., Barhoumi Ep Meddeb, A., Ounaies, Z., Lanagan, M. T. & Shallenberger, J., Nov 26 2018, 2018 IEEE CEIDP Conference on Electrical Insulation and Dielectric Phenomena, CEIDP 2018. Institute of Electrical and Electronics Engineers Inc., p. 9-13 5 p. 8544868. (Annual Report - Conference on Electrical Insulation and Dielectric Phenomena, CEIDP; vol. 2018-October).

    Research output: Chapter in Book/Report/Conference proceedingConference contribution

    2013

    Surface and interface characterization of polymer films

    Shallenberger, J., 2013, Web Coating and Handling Conference 2013. Association of International Metallizers, Coaters and Laminators, Vol. 2. p. 1274-1303 30 p.

    Research output: Chapter in Book/Report/Conference proceedingConference contribution

    1999

    Oxide thickness determination by XPS, AES, SIMS, RBS and TEM

    Shallenberger, J. R., Cole, D. A., Novak, S. W., Moore, R. L., Edgell, M. J., Smith, S. P., Hitzman, C. J., Kirchhoff, J. F., Principe, E., Biswas, S., Bleiler, R. J., Nieveen, W. & Jones, K., Dec 1 1999, Proceedings of the International Conference on Ion Implantation Technology. IEEE, p. 79-82 4 p. (Proceedings of the International Conference on Ion Implantation Technology; vol. 1).

    Research output: Chapter in Book/Report/Conference proceedingConference contribution

    14 Scopus citations

    Recent advances in XPS characterization of ultra-thin oxides

    Shallenberger, J., Cole, D. A., Downey, D. F., Falk, S. & Zhao, Z., Dec 1 1999, Proceedings of the International Conference on Ion Implantation Technology. IEEE, p. 566-569 4 p. (Proceedings of the International Conference on Ion Implantation Technology; vol. 1).

    Research output: Chapter in Book/Report/Conference proceedingConference contribution

    3 Scopus citations