Jeffrey Shallenberger

    • 368 Citations
    • 8 h-Index
    19962020

    Research output per year

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    2020

    Atomically thin half-van der Waals metals enabled by confinement heteroepitaxy

    Briggs, N., Bersch, B., Wang, Y., Jiang, J., Koch, R. J., Nayir, N., Wang, K., Kolmer, M., Ko, W., De La Fuente Duran, A., Subramanian, S., Dong, C., Shallenberger, J., Fu, M., Zou, Q., Chuang, Y. W., Gai, Z., Li, A. P., Bostwick, A., Jozwiak, C. & 6 others, Chang, C. Z., Rotenberg, E., Zhu, J., van Duin, A. C. T., Crespi, V. & Robinson, J. A., Jun 1 2020, In : Nature Materials. 19, 6, p. 637-643 7 p.

    Research output: Contribution to journalArticle

    1 Scopus citations

    Simultaneous Reduction and Polymerization of Graphene Oxide/Styrene Mixtures to Create Polymer Nanocomposites with Tunable Dielectric Constants

    Hou, D., Bostwick, J. E., Shallenberger, J. R., Zofchak, E. S., Colby, R. H., Liu, Q. & Hickey, R. J., Feb 28 2020, In : ACS Applied Nano Materials. 3, 2, p. 962-968 7 p.

    Research output: Contribution to journalArticle

    Open Access
    1 Scopus citations
    Open Access
    2019

    2D bismuth telluride analyzed by XPS

    Shallenberger, J. R., Smyth, C. M., Addou, R. & Wallace, R. M., Dec 1 2019, In : Surface Science Spectra. 26, 2, 024011.

    Research output: Contribution to journalArticle

    2D topological insulator bismuth selenide analyzed by in situ XPS

    Wang, X., Smyth, C. M., Khosravi, A., Cormier, C. R., Shallenberger, J. R., Addou, R. & Wallace, R. M., Dec 1 2019, In : Surface Science Spectra. 26, 2, 024014.

    Research output: Contribution to journalArticle

    Chemistry of Singlet Oxygen with a Cadmium-Sulfur Cluster: Physical Quenching versus Photooxidation

    Cagan, D. A., Garcia, A. C., Li, K., Ashen-Garry, D., Tadle, A. C., Zhang, D., Nelms, K. J., Liu, Y., Shallenberger, J. R., Stapleton, J. J. & Selke, M., Jan 9 2019, In : Journal of the American Chemical Society. 141, 1, p. 67-71 5 p.

    Research output: Contribution to journalArticle

    2 Scopus citations
    2018

    2D tungsten diselenide analyzed by XPS

    Shallenberger, J. R., Jun 1 2018, In : Surface Science Spectra. 25, 1, 014001.

    Research output: Contribution to journalArticle

    3 Scopus citations
    1 Scopus citations
    2017

    Performance stability of silicone oxide-coated plastic parenteral vials

    Weikart, C. M., Pantano, C. G. & Shallenberger, J., Jul 1 2017, In : PDA Journal of Pharmaceutical Science and Technology. 71, 4, p. 317-327 11 p.

    Research output: Contribution to journalArticle

    4 Scopus citations
    2013

    Analysis & materials characterization - Surface characterization of pharmaceuticals by x-ray photoelectron spectroscopy

    Shallenberger, J. & Lee, R. W., Jan 2013, Drug Delivery Technology, 13, 1.

    Research output: Contribution to specialist publicationArticle

    2007

    Studies of Hf(Si,O) dielectrics for metal-oxide-semiconductor applications

    Chang, K., Shanmugasundaram, K., Shallenberger, J. & Ruzyllo, J., Feb 26 2007, In : Thin Solid Films. 515, 7-8, p. 3802-3805 4 p.

    Research output: Contribution to journalArticle

    11 Scopus citations
    2006
    16 Scopus citations
    2003

    Adsorption of polyamides and polyamide-silane mixtures at glass surfaces

    Shallenberger, J. R., Metwalli, E. E., Pantano, C. G., Tuller, F. N. & Fry, D. F., Aug 1 2003, In : Surface and Interface Analysis. 35, 8, p. 667-672 6 p.

    Research output: Contribution to journalArticle

    17 Scopus citations
    2002

    Surface analysis of 24% lead crystal glass articles: Correlation with lead release

    Guadagnino, E., Verità, M., Geotti-Bianchini, F., Shallenberger, J. & Pantano, C. G., Apr 1 2002, In : Glass Technology. 43, 2, p. 63-69 7 p.

    Research output: Contribution to journalArticle

    7 Scopus citations
    2000

    SiO2 thickness determination by X-ray photoelectron spectroscopy, Auger electron spectroscopy, secondary ion mass spectrometry, Rutherford backscattering, transmission electron microscopy, and ellipsometry

    Cole, D. A., Shallenberger, J. R., Novak, S. W., Moore, R. L., Edgell, M. J., Smith, S. P., Hitzman, C. J., Kirchhoff, J. F., Principe, E., Nieveen, W., Huang, F. K., Biswas, S., Bleiler, R. J. & Jones, K., Jan 1 2000, In : Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures. 18, 1, p. 440-444 5 p.

    Research output: Contribution to journalArticle

    76 Scopus citations
    1999

    Characterization of silicon oxynitride thin films by x-ray photoelectron spectroscopy

    Shallenberger, J., Cole, D. A. & Novak, S. W., Jan 1 1999, In : Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films. 17, 4, p. 1086-1090 5 p.

    Research output: Contribution to journalArticle

    129 Scopus citations

    Effects of annealing on X-ray-amorphous CVD W-Si-N barrier layer materials

    Gokce, O. H., Amin, S., Ravindra, N. M., Szostak, D. J., Paff, R. J., Fleming, J. G., Galewski, C. J., Shallenberger, J. & Eby, R., Sep 29 1999, In : Thin Solid Films. 353, 1, p. 149-156 8 p.

    Research output: Contribution to journalArticle

    16 Scopus citations

    Structure and bonding in nitrided oxide films by sims and XPS

    Novak, S. W., Shallenberger, J., Cole, D. A. & Marino, J. W., 1999, In : Materials Research Society Symposium - Proceedings. 567, p. 579-586 8 p.

    Research output: Contribution to journalArticle

    4 Scopus citations
    1996
    57 Scopus citations