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Research Output 1990 2019

  • 564 Citations
  • 10 h-Index
  • 51 Article
  • 37 Conference article
  • 12 Conference contribution
  • 1 Paper
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Paper
1996
1 Citation (Scopus)

Nondestructive determination of boron doses in semiconductor materials using neutron depth profiling

Unlu, K., Saglam, M., Wehring, B. W., Hossain, T. Z., Custodio, E. & Lowell, J. K., Dec 1 1996, p. 575-578. 4 p.

Research output: Contribution to conferencePaper

Depth profiling
Boron
Neutrons
Semiconductor materials
Semiconductor devices