• 71 Citations
  • 5 h-Index
1989 …2015
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Research Output 1989 2015

  • 71 Citations
  • 5 h-Index
  • 13 Article
  • 4 Conference contribution
  • 2 Paper
  • 2 Conference article
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Paper
2002
3 Citations (Scopus)

Growth and reliability of thick gate oxide in U-trench for power MOSFET's

Wu, C. T., Ridley, R. S., Dolny, G., Grebs, T., Knoedler, C., Suliman, S., Venkataraman, B., Awadelkarim, O. & Ruzyllo, J., Jan 1 2002, p. 149-152. 4 p.

Research output: Contribution to conferencePaper

Oxidation
Oxides
Geometry
Growth kinetics
Temperature
2001
1 Citation (Scopus)

Characterization of gate oxide degradation mechanisms in trench-gated power MOSFETS using the charge-pumping technique

Dolny, G., Gollagunta, N., Suliman, S. A., Trabzon, L., Horn, M. W., Awadelkarim, O. O., Fonash, S. J., Knoedler, C. M., Hao, J., Ridley, R., Kocon, C., Grebs, T. & Zeng, J., Jan 1 2001, p. 431-434. 4 p.

Research output: Contribution to conferencePaper

Degradation
Oxides
High resolution electron microscopy
Transistors
Surface roughness