• 71 Citations
  • 5 h-Index
1989 …2015
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Research Output 1989 2015

  • 71 Citations
  • 5 h-Index
  • 13 Article
  • 4 Conference contribution
  • 2 Paper
  • 2 Conference article
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Conference article
2014

High-temperature reverse-bias stressing of thin gate oxides in power transistors

Suliman, S. A., Awadelkarim, O. O., Hao, J. & Rioux, M., Jan 1 2014, In : ECS Transactions. 64, 8, p. 45-52 8 p.

Research output: Contribution to journalConference article

Oxides
Degradation
Hydrogen
Temperature
Field effect transistors
2004
4 Citations (Scopus)
Silicon oxides
Oxides
metal oxides
Metals
Deep level transient spectroscopy