2D bismuth telluride analyzed by XPS

Jeffrey R. Shallenberger, Christopher M. Smyth, Rafik Addou, Robert M. Wallace

Research output: Contribution to journalArticle

Abstract

Bismuth telluride (Bi2Te3) was analyzed using x-ray photoelectron spectroscopy. A freshly exfoliated, oxygen-free flake was analyzed. Spectral regions for O 1s, Te 3d, C 1s, Bi 4f, Bi 5d, and Te 4d were acquired. Bulk quantitative analyses by x-ray fluorescence, inductively coupled plasma-mass spectrometry, and x-ray diffraction indicated that the material was stoichiometric, contained low concentrations of impurities, and was phase pure, respectively.

Original languageEnglish (US)
Article number024011
JournalSurface Science Spectra
Volume26
Issue number2
DOIs
StatePublished - Dec 1 2019

All Science Journal Classification (ASJC) codes

  • Condensed Matter Physics
  • Surfaces and Interfaces
  • Surfaces, Coatings and Films

Fingerprint Dive into the research topics of '2D bismuth telluride analyzed by XPS'. Together they form a unique fingerprint.

  • Cite this