2D bismuth telluride analyzed by XPS

Jeffrey R. Shallenberger, Christopher M. Smyth, Rafik Addou, Robert M. Wallace

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All Science Journal Classification (ASJC) codes

  • Condensed Matter Physics
  • Surfaces and Interfaces
  • Surfaces, Coatings and Films

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Shallenberger, Jeffrey R. ; Smyth, Christopher M. ; Addou, Rafik ; Wallace, Robert M. / 2D bismuth telluride analyzed by XPS. In: Surface Science Spectra. 2019 ; Vol. 26, No. 2.