2D topological insulator bismuth selenide analyzed by in situ XPS

Xinglu Wang, Christopher M. Smyth, Ava Khosravi, Christopher R. Cormier, Jeffrey R. Shallenberger, Rafik Addou, Robert M. Wallace

Research output: Contribution to journalArticle

Abstract

Bismuth selenide (Bi2Se3), a two-dimensional topological insulator material purchased from Alfa Aesar, was analyzed using in situ x-ray photoelectron spectroscopy (XPS). The XPS spectra obtained from a fresh surface exfoliated in ultrahigh vacuum include a survey scan, high resolution spectra of O 1s, Bi 5d, Se 3d, Bi 4f, Se 3p, Se LMM, C 1s, and the valence band. Quantitative analysis indicates a Se deficient surface composition of Bi2Se2.8, which is consistent with the Fermi level position in the conduction band detected in this work.

Original languageEnglish (US)
Article number024014
JournalSurface Science Spectra
Volume26
Issue number2
DOIs
StatePublished - Dec 1 2019

All Science Journal Classification (ASJC) codes

  • Condensed Matter Physics
  • Surfaces and Interfaces
  • Surfaces, Coatings and Films

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    Wang, X., Smyth, C. M., Khosravi, A., Cormier, C. R., Shallenberger, J. R., Addou, R., & Wallace, R. M. (2019). 2D topological insulator bismuth selenide analyzed by in situ XPS. Surface Science Spectra, 26(2), [024014]. https://doi.org/10.1116/1.5130891