3.2 Atomic force microscopy

Research output: Chapter in Book/Report/Conference proceedingChapter

Abstract

The atomic force microscope (AFM) is a member of the broad family of scanning near-field tools generally referred to as scanning probe microscopes (SPMs). The AFM operates by positioning a probe near to the surface in order to physically measure and map the morphology of a wide variety of biomaterials. Because the technique does not require a vacuum environment, the AFM has become increasingly important in the biomaterials community over the last nearly 3 decades. The AFM is not only viewed as a standard surface characterization tool, but the AFM has also become an important instrument for making high resolution biophysical measurements of cells, proteins, and DNA, as well as for the measurement of biological interactions. This article explores the utility of AFM within the fields of biomaterials science and life science and introduces a number of high-resolution imaging techniques and force measurements that can be addressed to a variety of biological systems, as well as the hybrid use of AFM with other techniques including IR and Confocal.

Original languageEnglish (US)
Title of host publicationComprehensive Biomaterials II
PublisherElsevier
Pages25-45
Number of pages21
ISBN (Electronic)9780081006924
ISBN (Print)9780081006917
DOIs
StatePublished - Jan 1 2017

All Science Journal Classification (ASJC) codes

  • Engineering(all)
  • Materials Science(all)

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