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2012
25 Citations (Scopus)

Giant amplification of spin dependent recombination at heterojunctions through a gate controlled bipolar effect

Aichinger, T. & Lenahan, P. M., Aug 20 2012, In : Applied Physics Letters. 101, 8, 083504.

Research output: Contribution to journalArticle

heterojunctions
transistors
sensitivity
acceleration (physics)
metal oxide semiconductors
42 Citations (Scopus)
metal oxides
field effect transistors
defects
silicon
traps
19 Citations (Scopus)
electromagnetic fields
electrons
interactions
magnetic resonance
electron paramagnetic resonance
2011
17 Citations (Scopus)

A model for NBTI in nitrided oxide MOSFETs which does not involve hydrogen or diffusion

Lenahan, P. M., Campbell, J. P., Krishnan, A. T. & Krishnan, S., Jun 1 2011, In : IEEE Transactions on Device and Materials Reliability. 11, 2, p. 219-226 8 p., 5535069.

Research output: Contribution to journalArticle

Oxides
Hydrogen
Defects
Silicon
Silicon Dioxide
60 Citations (Scopus)
metal oxide semiconductors
magnetic resonance
field effect transistors
defects
silicon
3 Citations (Scopus)

An electron paramagnetic resonance study of defects in interlay er dielectrics

Bittel, B. C., Pomorski, T. A., Lenahan, P. M. & King, S. W., Aug 2 2011, Silicon Nitride, Silicon Dioxide, and Emerging Dielectrics 11. 4 ed. p. 747-756 10 p. (ECS Transactions; vol. 35, no. 4).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Paramagnetic resonance
Defects
Leakage currents
ULSI circuits
Voltage measurement
21 Citations (Scopus)

Color center formation in vacuum sintered Nd3x Y3-3x Al5 O12 transparent ceramics

Stevenson, A. J., Bittel, B. C., Leh, C. G., Li, X., Dickey, E. C., Lenahan, P. M. & Messing, G. L., Jan 31 2011, In : Applied Physics Letters. 98, 5, 051906.

Research output: Contribution to journalArticle

color centers
ceramics
vacuum
electron paramagnetic resonance
resonance lines
1 Citation (Scopus)

Electrically detected magnetic resonance in dielectric semiconductor systems of current interest

Lenahan, P. M., Cochrane, C. J., Campbell, J. P. & Ryan, J. T., Aug 2 2011, Silicon Nitride, Silicon Dioxide, and Emerging Dielectrics 11. 4 ed. p. 605-627 23 p. (ECS Transactions; vol. 35, no. 4).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Magnetic resonance
Semiconductor materials
Defects
Dielectric films
Crystal defects
2 Citations (Scopus)

Electrically detected magnetic resonance study of a near interface trap in 4H SiC MOSFETs

Cochrane, C. J., Lenahan, P. M. & Lelis, A., Dec 1 2011, 2011 International Semiconductor Device Research Symposium, ISDRS 2011. 6135142. (2011 International Semiconductor Device Research Symposium, ISDRS 2011).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Silicon oxides
Magnetic resonance
Field effect transistors
Silicon carbide
Metals
3 Citations (Scopus)

Electron paramagnetic resonance studies of interlayer dielectrics

Bittel, B. C., Pomorski, T. A., Lenahan, P. M., King, S. & Mays, E., Dec 1 2011, 2011 IEEE International Integrated Reliability Workshop Final Report, IRW 2011. p. 50-54 5 p. 6142587. (IEEE International Integrated Reliability Workshop Final Report).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Leakage currents
Paramagnetic resonance
Defects
Electric current measurement
Permittivity

Electron spin resonance studies of interlayer dielectrics

Bittel, B. C., Pomorski, T. A., Lenahan, P. M. & King, S. W., Dec 1 2011, Advanced Metallization Conference 2011. p. 60-61 2 p. (Advanced Metallization Conference (AMC)).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Paramagnetic resonance
2 Citations (Scopus)

Spin dependent charge pumping: A new tool for reliability studies

Bittel, B. C., Lenahan, P. M., Ryan, J. T., Fronheiser, J. & Lelis, A. J., Dec 1 2011, 2011 IEEE International Integrated Reliability Workshop Final Report, IRW 2011. p. 142-145 4 p. 6142610

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Point defects
Paramagnetic resonance
Defects
1 Citation (Scopus)

Spin dependent charge pumping: A new tool for MOS interface characterization

Bittel, B. C., Lenahan, P. M., Ryan, J. T., Fronheiser, J. & Lelis, A. J., Dec 1 2011, 2011 International Semiconductor Device Research Symposium, ISDRS 2011. 6135250. (2011 International Semiconductor Device Research Symposium, ISDRS 2011).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Defects
Electronic properties
Paramagnetic resonance
Defect structures
Magnetic resonance
22 Citations (Scopus)

Spin dependent charge pumping in SiC metal-oxide-semiconductor field-effect-transistors

Bittel, B. C., Lenahan, P. M., Ryan, J. T., Fronheiser, J. & Lelis, A. J., Aug 22 2011, In : Applied Physics Letters. 99, 8, 083504.

Research output: Contribution to journalArticle

metal oxide semiconductors
pumping
field effect transistors
magnetic resonance
sensitivity
10 Citations (Scopus)

Trap-assisted conduction in Pt-gated Gd2O3/Si capacitors

Lipp, E., Shahar, Z., Bittel, B. C., Lenahan, P. M., Schwendt, D., Osten, H. J. & Eizenberg, M., Apr 1 2011, In : Journal of Applied Physics. 109, 7, 073724.

Research output: Contribution to journalArticle

capacitors
traps
conduction
oxides
carrier injection