A built-in self-testing method for embedded multiport memory arrays

V. Narayanan, S. Ghosh, W. B. Jone, S. R. Das

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

Multiport memories are widely used in multi-processor systems, telecommunication ASICs etc. Research papers which define multi-port memory fault models and give march tests for the same are currently available. However, little work has been done to use the power of serial interfacing for testing multi-port memories. In this paper, we discuss some basics about the architecture of two-port memories and fault models for the same. We have then used the serial testing mechanism to propose new algorithms which can prove effective to reduce the hardware cost considerably on a chip with many multi-port memories. Once the serial interfacing for two-port memory testing is understood, it can be extended for p-port memories (p>2). The proposed method based on the serial interfacing technique has the advantages of high fault coverage, low hardware overhead and tolerable test application time.

Original languageEnglish (US)
Title of host publicationProceedings of the 21st IEEE Instrumentation and Measurement Technology Conference, IMTC/04
EditorsS. Demidenko, R. Ottoboni, D. Petri, V. Piuri, D.C.T. Weng
Pages2027-2032
Number of pages6
DOIs
StatePublished - Oct 8 2004
EventProceedings of the 21st IEEE Instrumentation and Measurement Technology Conference, IMTC/04 - Como, Italy
Duration: May 18 2004May 20 2004

Publication series

NameConference Record - IEEE Instrumentation and Measurement Technology Conference
Volume3
ISSN (Print)1091-5281

Other

OtherProceedings of the 21st IEEE Instrumentation and Measurement Technology Conference, IMTC/04
CountryItaly
CityComo
Period5/18/045/20/04

All Science Journal Classification (ASJC) codes

  • Electrical and Electronic Engineering

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  • Cite this

    Narayanan, V., Ghosh, S., Jone, W. B., & Das, S. R. (2004). A built-in self-testing method for embedded multiport memory arrays. In S. Demidenko, R. Ottoboni, D. Petri, V. Piuri, & D. C. T. Weng (Eds.), Proceedings of the 21st IEEE Instrumentation and Measurement Technology Conference, IMTC/04 (pp. 2027-2032). (Conference Record - IEEE Instrumentation and Measurement Technology Conference; Vol. 3). https://doi.org/10.1109/IMTC.2004.1351487