A charge-based deep level transient spectroscopy measurement system and characterization of a ZnO-based varistor and a Fe-doped SrTiO3 dielectric

Takafumi Okamoto, Jeffrey Long, Rudeger H.T. Wilke, Joseph Stitt, Russell Maier, Clive A. Randall

Research output: Contribution to journalArticle

5 Citations (Scopus)

Abstract

A charge-based deep level transient spectroscopy (Q-DLTS) method is applied to provide insights into the electronic behavior near grain boundaries and may provide new insights into mechanisms such as fatigue, degradation, dielectric aging, and dielectric breakdown. Here, we tested the Q-DLTS in both a ZnO varistor material and Fe-doped SrTiO3 materials. Comparisons are made to other data on ZnO varistors, and we obtain very good agreement for the energy levels. The status of deep traps in Fe-doped SrTiO3 dielectrics has been investigated where the relaxation was contrasted in a single crystal and polycrystalline ceramic materials. The relaxation is only observable in the polycrystalline materials, and was absent in single crystal Fe-doped crystals indicating that the deep traps originating from the Schottky barriers at the grain boundaries provide the DLTS signals. The energy associated with this grain boundary trap was found to be 1.26 eV.

Original languageEnglish (US)
Article number026601
JournalJapanese Journal of Applied Physics
Volume55
Issue number2
DOIs
StatePublished - Feb 1 2016

Fingerprint

varistors
Varistors
Deep level transient spectroscopy
grain boundaries
traps
Polycrystalline materials
Grain boundaries
spectroscopy
single crystals
Single crystals
doped crystals
Ceramic materials
breakdown
energy levels
Electric breakdown
ceramics
Electron energy levels
degradation
Aging of materials
Fatigue of materials

All Science Journal Classification (ASJC) codes

  • Engineering(all)
  • Physics and Astronomy(all)

Cite this

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abstract = "A charge-based deep level transient spectroscopy (Q-DLTS) method is applied to provide insights into the electronic behavior near grain boundaries and may provide new insights into mechanisms such as fatigue, degradation, dielectric aging, and dielectric breakdown. Here, we tested the Q-DLTS in both a ZnO varistor material and Fe-doped SrTiO3 materials. Comparisons are made to other data on ZnO varistors, and we obtain very good agreement for the energy levels. The status of deep traps in Fe-doped SrTiO3 dielectrics has been investigated where the relaxation was contrasted in a single crystal and polycrystalline ceramic materials. The relaxation is only observable in the polycrystalline materials, and was absent in single crystal Fe-doped crystals indicating that the deep traps originating from the Schottky barriers at the grain boundaries provide the DLTS signals. The energy associated with this grain boundary trap was found to be 1.26 eV.",
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A charge-based deep level transient spectroscopy measurement system and characterization of a ZnO-based varistor and a Fe-doped SrTiO3 dielectric. / Okamoto, Takafumi; Long, Jeffrey; Wilke, Rudeger H.T.; Stitt, Joseph; Maier, Russell; Randall, Clive A.

In: Japanese Journal of Applied Physics, Vol. 55, No. 2, 026601, 01.02.2016.

Research output: Contribution to journalArticle

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AU - Long, Jeffrey

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AU - Maier, Russell

AU - Randall, Clive A.

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