A comparison of three-dimensional simulations of traveling-wave tube cold-test characteristics using CST microwave studio and Mafia

C. T. Chevalier, K. A. Herrmann, C. L. Kory, J. D. Wilson, A. W. Cross

Research output: Chapter in Book/Report/Conference proceedingConference contribution

7 Citations (Scopus)
Original languageEnglish (US)
Title of host publication3rd IEEE International Vacuum Electronics Conference, IVEC 2002
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages15-16
Number of pages2
ISBN (Electronic)0780372565, 9780780372566
DOIs
StatePublished - Jan 1 2002
Event3rd IEEE International Vacuum Electronics Conference, IVEC 2002 - Monterey, United States
Duration: Apr 23 2002Apr 25 2002

Publication series

Name3rd IEEE International Vacuum Electronics Conference, IVEC 2002

Other

Other3rd IEEE International Vacuum Electronics Conference, IVEC 2002
CountryUnited States
CityMonterey
Period4/23/024/25/02

Fingerprint

Traveling wave tubes
Studios
Microwaves

All Science Journal Classification (ASJC) codes

  • Electrical and Electronic Engineering

Cite this

Chevalier, C. T., Herrmann, K. A., Kory, C. L., Wilson, J. D., & Cross, A. W. (2002). A comparison of three-dimensional simulations of traveling-wave tube cold-test characteristics using CST microwave studio and Mafia. In 3rd IEEE International Vacuum Electronics Conference, IVEC 2002 (pp. 15-16). [999236] (3rd IEEE International Vacuum Electronics Conference, IVEC 2002). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/IVELEC.2002.999236
Chevalier, C. T. ; Herrmann, K. A. ; Kory, C. L. ; Wilson, J. D. ; Cross, A. W. / A comparison of three-dimensional simulations of traveling-wave tube cold-test characteristics using CST microwave studio and Mafia. 3rd IEEE International Vacuum Electronics Conference, IVEC 2002. Institute of Electrical and Electronics Engineers Inc., 2002. pp. 15-16 (3rd IEEE International Vacuum Electronics Conference, IVEC 2002).
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Chevalier, CT, Herrmann, KA, Kory, CL, Wilson, JD & Cross, AW 2002, A comparison of three-dimensional simulations of traveling-wave tube cold-test characteristics using CST microwave studio and Mafia. in 3rd IEEE International Vacuum Electronics Conference, IVEC 2002., 999236, 3rd IEEE International Vacuum Electronics Conference, IVEC 2002, Institute of Electrical and Electronics Engineers Inc., pp. 15-16, 3rd IEEE International Vacuum Electronics Conference, IVEC 2002, Monterey, United States, 4/23/02. https://doi.org/10.1109/IVELEC.2002.999236

A comparison of three-dimensional simulations of traveling-wave tube cold-test characteristics using CST microwave studio and Mafia. / Chevalier, C. T.; Herrmann, K. A.; Kory, C. L.; Wilson, J. D.; Cross, A. W.

3rd IEEE International Vacuum Electronics Conference, IVEC 2002. Institute of Electrical and Electronics Engineers Inc., 2002. p. 15-16 999236 (3rd IEEE International Vacuum Electronics Conference, IVEC 2002).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

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Chevalier CT, Herrmann KA, Kory CL, Wilson JD, Cross AW. A comparison of three-dimensional simulations of traveling-wave tube cold-test characteristics using CST microwave studio and Mafia. In 3rd IEEE International Vacuum Electronics Conference, IVEC 2002. Institute of Electrical and Electronics Engineers Inc. 2002. p. 15-16. 999236. (3rd IEEE International Vacuum Electronics Conference, IVEC 2002). https://doi.org/10.1109/IVELEC.2002.999236