A comparison of three-dimensional simulations of traveling-wave tube cold-test characteristics using CST microwave studio and Mafia

C. T. Chevalier, K. A. Herrmann, C. L. Kory, J. D. Wilson, A. W. Cross

Research output: Chapter in Book/Report/Conference proceedingConference contribution

7 Scopus citations
Original languageEnglish (US)
Title of host publication3rd IEEE International Vacuum Electronics Conference, IVEC 2002
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages15-16
Number of pages2
ISBN (Electronic)0780372565, 9780780372566
DOIs
StatePublished - 2002
Event3rd IEEE International Vacuum Electronics Conference, IVEC 2002 - Monterey, United States
Duration: Apr 23 2002Apr 25 2002

Publication series

Name3rd IEEE International Vacuum Electronics Conference, IVEC 2002

Other

Other3rd IEEE International Vacuum Electronics Conference, IVEC 2002
CountryUnited States
CityMonterey
Period4/23/024/25/02

All Science Journal Classification (ASJC) codes

  • Electrical and Electronic Engineering

Cite this