A data-centric approach to checksum reuse for array-intensive applications

G. Chen, M. Kandemir, M. Karakoy

Research output: Contribution to conferencePaper

6 Scopus citations

Abstract

Soft errors are transient faults that occur in VLSI circuits due to external radiation and affect the logic states of sensitive components. While many systems implement hardware-based protection techniques like ECC and other approaches to ensure an acceptable level of robustness against these errors, such solutions are generally very rigid and costly. Recent research discussed checksum-based software solutions that can be used in the context of array-intensive computations. While a checksum-based scheme can be more flexible than a hardware-based approach to reliability, it can also bring significant runtime overheads. Focusing on array-intensive applications, this paper proposes a compiler-directed data-centric strategy that maximizes reuse of checksums, A unique characteristic of the proposed scheme is that it can work with a given checksum assignment, and automatically - under compiler guidance - restructures the entire application code to maximize checksum reuse. This scheme can reduce checksum recomputing even further by inter-procedural checksum reuse. Our experiments clearly show that the proposed approach reduces the number of checksum calculations required by the previous work.

Original languageEnglish (US)
Pages316-325
Number of pages10
DOIs
StatePublished - Nov 9 2005
Event2005 International Conference on Dependable Systems and Networks - Yokohama, Japan
Duration: Jun 28 2005Jul 1 2005

Other

Other2005 International Conference on Dependable Systems and Networks
CountryJapan
CityYokohama
Period6/28/057/1/05

All Science Journal Classification (ASJC) codes

  • Software
  • Hardware and Architecture
  • Computer Networks and Communications

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    Chen, G., Kandemir, M., & Karakoy, M. (2005). A data-centric approach to checksum reuse for array-intensive applications. 316-325. Paper presented at 2005 International Conference on Dependable Systems and Networks, Yokohama, Japan. https://doi.org/10.1109/DSN.2005.5