Abstract
Physically Unclonable Functions (PUF) are security primitives to combat Integrated Circuit (IC) cloning and counterfeiting. The response of the PUF is expected to be stable under environmental fluctuations (e.g., temperature and voltage fluctuation). Our analysis indicate that conventional arbiter PUF experiences significant variations due to environmental fluctuation degrading quality. In this paper we propose a novel Schmitt-Trigger (ST) based PUF that exploits the susceptibility of ST to process variations to realize high-quality robust arbiter type PUF. Extensive simulations show significant improvement of quality metrics e.g., inter and intra-die hamming distance and NIST tests with the proposed ST-PUF at the cost of area, power and throughput overhead. Based on this observation, we propose a family of low-overhead ST-PUF flavors that amplify the effect of process variations and achieve similar quality as ST-PUF. We also propose the concept of selective challenge pruning to screen the unstable challenge-response pairs for improving the quality and stability further.
| Original language | English (US) |
|---|---|
| Title of host publication | Proceedings of the 2015 IEEE International Symposium on Hardware-Oriented Security and Trust, HOST 2015 |
| Publisher | Institute of Electrical and Electronics Engineers Inc. |
| Pages | 32-37 |
| Number of pages | 6 |
| ISBN (Electronic) | 9781467374200 |
| DOIs | |
| State | Published - Jun 29 2015 |
| Event | 2015 IEEE International Symposium on Hardware-Oriented Security and Trust, HOST 2015 - McLean, United States Duration: May 5 2015 → May 7 2015 |
Publication series
| Name | Proceedings of the 2015 IEEE International Symposium on Hardware-Oriented Security and Trust, HOST 2015 |
|---|
Other
| Other | 2015 IEEE International Symposium on Hardware-Oriented Security and Trust, HOST 2015 |
|---|---|
| Country | United States |
| City | McLean |
| Period | 5/5/15 → 5/7/15 |
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All Science Journal Classification (ASJC) codes
- Safety, Risk, Reliability and Quality
- Hardware and Architecture
- Electrical and Electronic Engineering
Cite this
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A family of Schmitt-Trigger-based arbiter-PUFs and selective challenge-pruning for robustness and quality. / Lin, Cheng Wei; Ghosh, Swaroop.
Proceedings of the 2015 IEEE International Symposium on Hardware-Oriented Security and Trust, HOST 2015. Institute of Electrical and Electronics Engineers Inc., 2015. p. 32-37 7140232 (Proceedings of the 2015 IEEE International Symposium on Hardware-Oriented Security and Trust, HOST 2015).Research output: Chapter in Book/Report/Conference proceeding › Conference contribution
TY - GEN
T1 - A family of Schmitt-Trigger-based arbiter-PUFs and selective challenge-pruning for robustness and quality
AU - Lin, Cheng Wei
AU - Ghosh, Swaroop
PY - 2015/6/29
Y1 - 2015/6/29
N2 - Physically Unclonable Functions (PUF) are security primitives to combat Integrated Circuit (IC) cloning and counterfeiting. The response of the PUF is expected to be stable under environmental fluctuations (e.g., temperature and voltage fluctuation). Our analysis indicate that conventional arbiter PUF experiences significant variations due to environmental fluctuation degrading quality. In this paper we propose a novel Schmitt-Trigger (ST) based PUF that exploits the susceptibility of ST to process variations to realize high-quality robust arbiter type PUF. Extensive simulations show significant improvement of quality metrics e.g., inter and intra-die hamming distance and NIST tests with the proposed ST-PUF at the cost of area, power and throughput overhead. Based on this observation, we propose a family of low-overhead ST-PUF flavors that amplify the effect of process variations and achieve similar quality as ST-PUF. We also propose the concept of selective challenge pruning to screen the unstable challenge-response pairs for improving the quality and stability further.
AB - Physically Unclonable Functions (PUF) are security primitives to combat Integrated Circuit (IC) cloning and counterfeiting. The response of the PUF is expected to be stable under environmental fluctuations (e.g., temperature and voltage fluctuation). Our analysis indicate that conventional arbiter PUF experiences significant variations due to environmental fluctuation degrading quality. In this paper we propose a novel Schmitt-Trigger (ST) based PUF that exploits the susceptibility of ST to process variations to realize high-quality robust arbiter type PUF. Extensive simulations show significant improvement of quality metrics e.g., inter and intra-die hamming distance and NIST tests with the proposed ST-PUF at the cost of area, power and throughput overhead. Based on this observation, we propose a family of low-overhead ST-PUF flavors that amplify the effect of process variations and achieve similar quality as ST-PUF. We also propose the concept of selective challenge pruning to screen the unstable challenge-response pairs for improving the quality and stability further.
UR - http://www.scopus.com/inward/record.url?scp=84942581916&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=84942581916&partnerID=8YFLogxK
U2 - 10.1109/HST.2015.7140232
DO - 10.1109/HST.2015.7140232
M3 - Conference contribution
T3 - Proceedings of the 2015 IEEE International Symposium on Hardware-Oriented Security and Trust, HOST 2015
SP - 32
EP - 37
BT - Proceedings of the 2015 IEEE International Symposium on Hardware-Oriented Security and Trust, HOST 2015
PB - Institute of Electrical and Electronics Engineers Inc.
ER -