A fine-grained damage management scheme in a self-healing postgreSQL system

Kun Bai, Peng Liu

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

Database Damage Management is an important issue in today's E-Business world. Self-healing capability is an indispensable part of the modern database system to assure high level data availability and integrity for misssion/life/business applications. Although a number of research projects have been done to tackle the emerging data damage threats to DBMS, existing mechanisms are still limited in finely distinguishing uncontaminated data from true corrupted data, which causes availability loss. In this paper, we propose TRACE-FG, a fine-grained zero-system- down-time database damage tracking, quarantine, and recovery solution with negligible run time overhead. TRACE-FG is able to decompose the "in-danger" unit and save the legitimated work. We built TRACE-FG into the kernel of PostgreSQL. Our experimental results demonstrated that TRACE-FG outperforms the original TRACE system and the standard recovery mechanism in terms of data availability and system service delay.

Original languageEnglish (US)
Title of host publicationProceedings - 11th IEEE High Assurance Systems Engineering Symposium, HASE 2008
Pages373-382
Number of pages10
DOIs
StatePublished - Dec 1 2008
Event11th IEEE High Assurance Systems Engineering Symposium, HASE 2008 - Nanjing, China
Duration: Dec 3 2008Dec 5 2008

Publication series

NameProceedings of IEEE International Symposium on High Assurance Systems Engineering
ISSN (Print)1530-2059

Other

Other11th IEEE High Assurance Systems Engineering Symposium, HASE 2008
CountryChina
CityNanjing
Period12/3/0812/5/08

All Science Journal Classification (ASJC) codes

  • Software
  • Safety, Risk, Reliability and Quality

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  • Cite this

    Bai, K., & Liu, P. (2008). A fine-grained damage management scheme in a self-healing postgreSQL system. In Proceedings - 11th IEEE High Assurance Systems Engineering Symposium, HASE 2008 (pp. 373-382). [4708895] (Proceedings of IEEE International Symposium on High Assurance Systems Engineering). https://doi.org/10.1109/HASE.2008.33