A framework for estimating NBTI degradation of microarchitectural components

Michael Debole, K. Ramakrishnan, Varsha Balakrishnan, Wenping Wang, Hong Luo, Yu Wang, Yuan Xie, Yu Cao, Vijaykrishnan Narayanan

Research output: Chapter in Book/Report/Conference proceedingConference contribution

12 Citations (Scopus)

Abstract

Degradation of device parameters over the lifetime of a system is emerging as a significant threat to system reliability. Among the aging mechanisms, wearout resulting from NBTI is of particular concern in deep submicron technology generations. To facilitate architectural level aging analysis, a tool capable of evaluating NBTI vulnerabilities early in the design cycle has been developed. The tool includes workload-based temperature and performance degradation analysis across a variety of technologies and operating conditions, revealing a complex interplay between factors influencing NBTI timing degradation.

Original languageEnglish (US)
Title of host publicationProceedings of the ASP-DAC 2009
Subtitle of host publicationAsia and South Pacific Design Automation Conference 2009
Pages455-460
Number of pages6
DOIs
StatePublished - Apr 20 2009
EventAsia and South Pacific Design Automation Conference 2009, ASP-DAC 2009 - Yokohama, Japan
Duration: Jan 19 2009Jan 22 2009

Publication series

NameProceedings of the Asia and South Pacific Design Automation Conference, ASP-DAC

Other

OtherAsia and South Pacific Design Automation Conference 2009, ASP-DAC 2009
CountryJapan
CityYokohama
Period1/19/091/22/09

Fingerprint

Degradation
Aging of materials
Negative bias temperature instability
Temperature

All Science Journal Classification (ASJC) codes

  • Computer Science Applications
  • Computer Graphics and Computer-Aided Design
  • Electrical and Electronic Engineering

Cite this

Debole, M., Ramakrishnan, K., Balakrishnan, V., Wang, W., Luo, H., Wang, Y., ... Narayanan, V. (2009). A framework for estimating NBTI degradation of microarchitectural components. In Proceedings of the ASP-DAC 2009: Asia and South Pacific Design Automation Conference 2009 (pp. 455-460). [4796522] (Proceedings of the Asia and South Pacific Design Automation Conference, ASP-DAC). https://doi.org/10.1109/ASPDAC.2009.4796522
Debole, Michael ; Ramakrishnan, K. ; Balakrishnan, Varsha ; Wang, Wenping ; Luo, Hong ; Wang, Yu ; Xie, Yuan ; Cao, Yu ; Narayanan, Vijaykrishnan. / A framework for estimating NBTI degradation of microarchitectural components. Proceedings of the ASP-DAC 2009: Asia and South Pacific Design Automation Conference 2009. 2009. pp. 455-460 (Proceedings of the Asia and South Pacific Design Automation Conference, ASP-DAC).
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Debole, M, Ramakrishnan, K, Balakrishnan, V, Wang, W, Luo, H, Wang, Y, Xie, Y, Cao, Y & Narayanan, V 2009, A framework for estimating NBTI degradation of microarchitectural components. in Proceedings of the ASP-DAC 2009: Asia and South Pacific Design Automation Conference 2009., 4796522, Proceedings of the Asia and South Pacific Design Automation Conference, ASP-DAC, pp. 455-460, Asia and South Pacific Design Automation Conference 2009, ASP-DAC 2009, Yokohama, Japan, 1/19/09. https://doi.org/10.1109/ASPDAC.2009.4796522

A framework for estimating NBTI degradation of microarchitectural components. / Debole, Michael; Ramakrishnan, K.; Balakrishnan, Varsha; Wang, Wenping; Luo, Hong; Wang, Yu; Xie, Yuan; Cao, Yu; Narayanan, Vijaykrishnan.

Proceedings of the ASP-DAC 2009: Asia and South Pacific Design Automation Conference 2009. 2009. p. 455-460 4796522 (Proceedings of the Asia and South Pacific Design Automation Conference, ASP-DAC).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

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Debole M, Ramakrishnan K, Balakrishnan V, Wang W, Luo H, Wang Y et al. A framework for estimating NBTI degradation of microarchitectural components. In Proceedings of the ASP-DAC 2009: Asia and South Pacific Design Automation Conference 2009. 2009. p. 455-460. 4796522. (Proceedings of the Asia and South Pacific Design Automation Conference, ASP-DAC). https://doi.org/10.1109/ASPDAC.2009.4796522