A framework for estimating NBTI degradation of microarchitectural components

Michael Debole, K. Ramakrishnan, Varsha Balakrishnan, Wenping Wang, Hong Luo, Yu Wang, Yuan Xie, Yu Cao, N. Vijaykrishnan

Research output: Chapter in Book/Report/Conference proceedingConference contribution

13 Scopus citations

Abstract

Degradation of device parameters over the lifetime of a system is emerging as a significant threat to system reliability. Among the aging mechanisms, wearout resulting from NBTI is of particular concern in deep submicron technology generations. To facilitate architectural level aging analysis, a tool capable of evaluating NBTI vulnerabilities early in the design cycle has been developed. The tool includes workload-based temperature and performance degradation analysis across a variety of technologies and operating conditions, revealing a complex interplay between factors influencing NBTI timing degradation.

Original languageEnglish (US)
Title of host publicationProceedings of the ASP-DAC 2009
Subtitle of host publicationAsia and South Pacific Design Automation Conference 2009
Pages455-460
Number of pages6
DOIs
StatePublished - 2009
EventAsia and South Pacific Design Automation Conference 2009, ASP-DAC 2009 - Yokohama, Japan
Duration: Jan 19 2009Jan 22 2009

Publication series

NameProceedings of the Asia and South Pacific Design Automation Conference, ASP-DAC

Other

OtherAsia and South Pacific Design Automation Conference 2009, ASP-DAC 2009
CountryJapan
CityYokohama
Period1/19/091/22/09

All Science Journal Classification (ASJC) codes

  • Computer Science Applications
  • Computer Graphics and Computer-Aided Design
  • Electrical and Electronic Engineering

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