A high resolution X-ray spectrometer utilizing Kirkpatrick-Baez optics and off-plane gratings

Randall Lee McEntaffer, Rene Hudec, Neil J. Murray, Andrew D. Holland

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

We present the design of a high resolution X-ray spectrometer for space based X-ray studies. This novel design utilizes a Kirkpatrick-Baez geometry with an off-plane grating as the secondary optic. This design has been proposed to NASA for flight onboard a suborbital rocket. The approach is low cost, low risk and has applications for future orbital missions.

Original languageEnglish (US)
Title of host publicationEUV and X-Ray Optics
Subtitle of host publicationSynergy between Laboratory and Space
PublisherSPIE
ISBN (Print)9780819476340
DOIs
StatePublished - Jan 1 2009
EventEUV and X-Ray Optics: Synergy between Laboratory and Space - Prague, Czech Republic
Duration: Apr 20 2009Apr 22 2009

Publication series

NameProceedings of SPIE - The International Society for Optical Engineering
Volume7360
ISSN (Print)0277-786X

Other

OtherEUV and X-Ray Optics: Synergy between Laboratory and Space
CountryCzech Republic
CityPrague
Period4/20/094/22/09

All Science Journal Classification (ASJC) codes

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Computer Science Applications
  • Applied Mathematics
  • Electrical and Electronic Engineering

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  • Cite this

    McEntaffer, R. L., Hudec, R., Murray, N. J., & Holland, A. D. (2009). A high resolution X-ray spectrometer utilizing Kirkpatrick-Baez optics and off-plane gratings. In EUV and X-Ray Optics: Synergy between Laboratory and Space [736014] (Proceedings of SPIE - The International Society for Optical Engineering; Vol. 7360). SPIE. https://doi.org/10.1117/12.829137