A low cost platform made of a silicon nitride window with pre-patterned metallic leads has been fabricated. The platform is compatible for both transmission electron microscopy (TEM) studies and electrical transport measurements. We demonstrated that TEM analyses, in situ local structure modification with a high intensity electron beam and ex situ transport measurements can be performed for the same individual nanowire assembled on this platform. The platform can therefore be used to directly link the transport properties of a testing nanomaterial or a nanodevice to its morphological, structural and chemical properties.
All Science Journal Classification (ASJC) codes
- Materials Science(all)
- Mechanics of Materials
- Mechanical Engineering
- Electrical and Electronic Engineering