A low cost platform for linking transport properties to the structure of nanomaterials

S. Y. Xu, J. Xu, M. L. Tian

Research output: Contribution to journalArticle

11 Citations (Scopus)

Abstract

A low cost platform made of a silicon nitride window with pre-patterned metallic leads has been fabricated. The platform is compatible for both transmission electron microscopy (TEM) studies and electrical transport measurements. We demonstrated that TEM analyses, in situ local structure modification with a high intensity electron beam and ex situ transport measurements can be performed for the same individual nanowire assembled on this platform. The platform can therefore be used to directly link the transport properties of a testing nanomaterial or a nanodevice to its morphological, structural and chemical properties.

Original languageEnglish (US)
Pages (from-to)1470-1475
Number of pages6
JournalNanotechnology
Volume17
Issue number5
DOIs
StatePublished - Mar 14 2006

Fingerprint

Nanostructured materials
Transport properties
platforms
transport properties
Transmission electron microscopy
Silicon nitride
Chemical properties
Nanowires
Structural properties
Costs
Electron beams
transmission electron microscopy
Testing
silicon nitrides
chemical properties
nanowires
electron beams
silicon nitride

All Science Journal Classification (ASJC) codes

  • Bioengineering
  • Chemistry(all)
  • Materials Science(all)
  • Mechanics of Materials
  • Mechanical Engineering
  • Electrical and Electronic Engineering

Cite this

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A low cost platform for linking transport properties to the structure of nanomaterials. / Xu, S. Y.; Xu, J.; Tian, M. L.

In: Nanotechnology, Vol. 17, No. 5, 14.03.2006, p. 1470-1475.

Research output: Contribution to journalArticle

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