A new method for measuring thermal conductivity of thin films

S. Govorkov, W. Ruderman, M. W. Horn, R. B. Goodman, M. Rothschild

Research output: Contribution to journalArticlepeer-review

50 Scopus citations

Fingerprint

Dive into the research topics of 'A new method for measuring thermal conductivity of thin films'. Together they form a unique fingerprint.

Engineering & Materials Science

Medicine & Life Sciences

Physics & Astronomy