A novel approach to modeling single event upsets in digital microelectronic devices

S. M. Cetiner, C. Celik, K. Ünl̈u, V. Narayanan, M. J. Irwin, Y. Xie

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

A new Monte Carlo toolkit Single Event Upset Simulator (SEUS) is under development. The code models the particle interactions on a constrained reaction space with detailed geometrical representation. Nucleon-nucleus interactions relevant to single event upsets are compiled from the simulation results of various intranuclear codes as well as from various cross section libraries such as ENDF/B-xx with a predefined energy group structure. The reaction products are then sampled from the precompiled library of an ensemble of all possible reaction exit channels. In this work, the development of the first module of the toolkit will be presented. The toolkit is implemented in C++ to ease integration with GEANT4.

Original languageEnglish (US)
Title of host publicationAmerican Nuclear Society - International Conference on Advances in Nuclear Power Plants, ICAPP 2008
Pages853-860
Number of pages8
StatePublished - Dec 1 2008
EventInternational Conference on Advances in Nuclear Power Plants, ICAPP 2008 - Anaheim, CA, United States
Duration: Jun 8 2008Jun 12 2008

Publication series

NameInternational Conference on Advances in Nuclear Power Plants, ICAPP 2008
Volume2

Other

OtherInternational Conference on Advances in Nuclear Power Plants, ICAPP 2008
CountryUnited States
CityAnaheim, CA
Period6/8/086/12/08

Fingerprint

Microelectronics
Particle interactions
Reaction products
Simulators

All Science Journal Classification (ASJC) codes

  • Fuel Technology
  • Nuclear Energy and Engineering

Cite this

Cetiner, S. M., Celik, C., Ünl̈u, K., Narayanan, V., Irwin, M. J., & Xie, Y. (2008). A novel approach to modeling single event upsets in digital microelectronic devices. In American Nuclear Society - International Conference on Advances in Nuclear Power Plants, ICAPP 2008 (pp. 853-860). (International Conference on Advances in Nuclear Power Plants, ICAPP 2008; Vol. 2).
Cetiner, S. M. ; Celik, C. ; Ünl̈u, K. ; Narayanan, V. ; Irwin, M. J. ; Xie, Y. / A novel approach to modeling single event upsets in digital microelectronic devices. American Nuclear Society - International Conference on Advances in Nuclear Power Plants, ICAPP 2008. 2008. pp. 853-860 (International Conference on Advances in Nuclear Power Plants, ICAPP 2008).
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Cetiner, SM, Celik, C, Ünl̈u, K, Narayanan, V, Irwin, MJ & Xie, Y 2008, A novel approach to modeling single event upsets in digital microelectronic devices. in American Nuclear Society - International Conference on Advances in Nuclear Power Plants, ICAPP 2008. International Conference on Advances in Nuclear Power Plants, ICAPP 2008, vol. 2, pp. 853-860, International Conference on Advances in Nuclear Power Plants, ICAPP 2008, Anaheim, CA, United States, 6/8/08.

A novel approach to modeling single event upsets in digital microelectronic devices. / Cetiner, S. M.; Celik, C.; Ünl̈u, K.; Narayanan, V.; Irwin, M. J.; Xie, Y.

American Nuclear Society - International Conference on Advances in Nuclear Power Plants, ICAPP 2008. 2008. p. 853-860 (International Conference on Advances in Nuclear Power Plants, ICAPP 2008; Vol. 2).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

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Cetiner SM, Celik C, Ünl̈u K, Narayanan V, Irwin MJ, Xie Y. A novel approach to modeling single event upsets in digital microelectronic devices. In American Nuclear Society - International Conference on Advances in Nuclear Power Plants, ICAPP 2008. 2008. p. 853-860. (International Conference on Advances in Nuclear Power Plants, ICAPP 2008).