A novel graphical technique for selection of a Robust design point

José G. Colom, Russell Richard Barton, Lynn Carpenter, Rafael Rodríguez Solís

Research output: Contribution to journalConference article

Abstract

A novel graphical technique for selecting a robust design point was discussed. The technique was focussed on microwave circuit design. A metal layer at the bottom was used as as the ground plane, while the top metal layer was etched to a specific geometry that provided the desired frequency response. With the use of a statistical technique, Design of Experiments (DoE) the input parameters of the system, or factors are deliberately and systematically changed to capture variations in the output response. The technique was used in the combination with a metamodel. The technique is useful when more than one output variables are considered.

Original languageEnglish (US)
Pages (from-to)833-840
Number of pages8
JournalASEE Annual Conference Proceedings
StatePublished - Dec 1 2001
Event2001 ASEE Annual Conference and Exposition: Peppers, Papers, Pueblos and Professors - Albuquerque, NM, United States
Duration: Jun 24 2001Jun 27 2001

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Microwave circuits
Metals
Design of experiments
Frequency response
Geometry

All Science Journal Classification (ASJC) codes

  • Engineering(all)

Cite this

Colom, José G. ; Barton, Russell Richard ; Carpenter, Lynn ; Solís, Rafael Rodríguez. / A novel graphical technique for selection of a Robust design point. In: ASEE Annual Conference Proceedings. 2001 ; pp. 833-840.
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A novel graphical technique for selection of a Robust design point. / Colom, José G.; Barton, Russell Richard; Carpenter, Lynn; Solís, Rafael Rodríguez.

In: ASEE Annual Conference Proceedings, 01.12.2001, p. 833-840.

Research output: Contribution to journalConference article

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