A novel slope detection technique for robust STTRAM sensing

Seyedhamidreza Motaman, Swaroop Ghosh, Jaydeep P. Kulkarni

Research output: Chapter in Book/Report/Conference proceedingConference contribution

14 Scopus citations

Abstract

Spin-Torque-Transfer RAM (STTRAM) is a promising technology for high density on-chip cache due to low standby power and high speed. However, the process variation of magnetic tunnel junction (MTJ) and access transistor poses serious challenge to sensing. Nondestructive sensing suffers from reference resistance variation whereas destructive sensing suffers from failures due to unoptimized selection of data and reference currents. We propose a novel slope detection technique to exploit MTJ resistance switching from high to low state using low-overhead sample-and-hold circuit. The proposed sensing technique is destructive in nature and can be combined with double sampling for improved robustness. Simulation results reveal <0.12% failure under process variation using single sampling (at 0.2% area overhead) and <0.08% failures with double sampling (at 0.6% area overhead). The overall sense time is found to be 6.8ns.

Original languageEnglish (US)
Title of host publicationProceedings of the International Symposium on Low Power Electronics and Design, ISLPED 2015
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages7-12
Number of pages6
ISBN (Electronic)9781467380096
DOIs
StatePublished - Sep 21 2015
Event20th IEEE/ACM International Symposium on Low Power Electronics and Design, ISLPED 2015 - Rome, Italy
Duration: Jul 22 2015Jul 24 2015

Publication series

NameProceedings of the International Symposium on Low Power Electronics and Design
Volume2015-September
ISSN (Print)1533-4678

Other

Other20th IEEE/ACM International Symposium on Low Power Electronics and Design, ISLPED 2015
CountryItaly
CityRome
Period7/22/157/24/15

All Science Journal Classification (ASJC) codes

  • Engineering(all)

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    Motaman, S., Ghosh, S., & Kulkarni, J. P. (2015). A novel slope detection technique for robust STTRAM sensing. In Proceedings of the International Symposium on Low Power Electronics and Design, ISLPED 2015 (pp. 7-12). [7273482] (Proceedings of the International Symposium on Low Power Electronics and Design; Vol. 2015-September). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/ISLPED.2015.7273482