The first generation of X-ray telescopes to use Charge-Coupled Devices (CCDs) is being launched this decade. With a read noise of a few electrons, CCDs provide Fano-limited spectral resolution across the soft X-ray band (0.1 - 10 keV). However, degradation of resolution due to charge transfer losses becomes noticeable as Charge Transfer Inefficiency (CTI) increases to 10-5. In this paper, we present a model which calculates the effects of radiation damage in low Earth orbit in order to predict CCD lifetimes over which good charge transfer is maintained. The model presented here considers damage mechanisms within the CCD, environmental conditions in which the CCD operates, and experiment shielding. We find that the predicted CTI approaches 10-5 after a one to two year mission for the flight instruments considered here.
All Science Journal Classification (ASJC) codes
- Astronomy and Astrophysics
- Space and Planetary Science