TY - GEN
T1 - A resonance-induced sensitivity enhancement method for conductivity sensors
AU - Shih, Chi Yuan
AU - Li, Wei
AU - Zheng, Siyang
AU - Tai, Yu Chong
PY - 2006
Y1 - 2006
N2 - We demonstrated in this paper a novel technique named Resonance-Induced Sensitivity Enhancement (RISE) method to be used for significantly improving the sensitivity of a variety of conductivity sensing devices. The technique works by introducing a parallel inductor to the conductivity sensor cell and operating the sensor system at the resonant frequency of its equivalent circuit model. At the resonant frequency, parasitic capacitances that are either in series or in parallel with the target conductance can be virtually removed from the equivalent circuit and therefore a much higher sensitivity to the target conductance is obtained. In a specific example, the sensitivity of a microchip capacitively-coupled contactless conductivity detector (C4D) can be improved by more than 10,000 times.
AB - We demonstrated in this paper a novel technique named Resonance-Induced Sensitivity Enhancement (RISE) method to be used for significantly improving the sensitivity of a variety of conductivity sensing devices. The technique works by introducing a parallel inductor to the conductivity sensor cell and operating the sensor system at the resonant frequency of its equivalent circuit model. At the resonant frequency, parasitic capacitances that are either in series or in parallel with the target conductance can be virtually removed from the equivalent circuit and therefore a much higher sensitivity to the target conductance is obtained. In a specific example, the sensitivity of a microchip capacitively-coupled contactless conductivity detector (C4D) can be improved by more than 10,000 times.
UR - http://www.scopus.com/inward/record.url?scp=50149093106&partnerID=8YFLogxK
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U2 - 10.1109/ICSENS.2007.355772
DO - 10.1109/ICSENS.2007.355772
M3 - Conference contribution
AN - SCOPUS:50149093106
SN - 1424403766
SN - 9781424403769
T3 - Proceedings of IEEE Sensors
SP - 271
EP - 274
BT - 2006 5th IEEE Conference on Sensors
T2 - 2006 5th IEEE Conference on Sensors
Y2 - 22 October 2006 through 25 October 2006
ER -