A simple method for restoring passivity in S-parameters using singular value decomposition

E. Douglas Campbell, Aldo W. Morales, Sedig Salem Agili

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

With new high speed data standards, such as USB 3.0, data rate has increased up to 5 Gbps (a 10-fold increase from USB 2.0) creating new challenges for a design engineer. Amid these speeds, issues like crosstalk, signal integrity and bit-error rates are coming to the forefront of the design cycle, especially for consumer electronics-related devices. Therefore, there is a need of accurate methods to characterize device behavior at high frequencies. For instance, S-parameter characterization of high speed interconnect components by full wave field solvers, macromodels and physical measurement are prone to numerical, modeling, and measurement error. This error can lead to nonphysical results such as passivity violations. This is a major problem in modern package design where extensive signal integrity simulations are required to validate a systems performance and passivity violations can cause such simulations to fail completely. This paper presents a new method for restoring passivity to non-passive S-parameter data by using singular value decomposition. Simulations show promising results although the method is limited to passivity violations of 1dB.

Original languageEnglish (US)
Title of host publicationICCE 2010 - 2010 Digest of Technical Papers International Conference on Consumer Electronics
Pages219-220
Number of pages2
DOIs
StatePublished - Apr 1 2010
Event2010 International Conference on Consumer Electronics, ICCE 2010 - Las Vegas, NV, United States
Duration: Jan 11 2010Jan 13 2010

Other

Other2010 International Conference on Consumer Electronics, ICCE 2010
CountryUnited States
CityLas Vegas, NV
Period1/11/101/13/10

Fingerprint

Scattering parameters
Singular value decomposition
Consumer electronics
Crosstalk
Measurement errors
Bit error rate
Engineers

All Science Journal Classification (ASJC) codes

  • Electrical and Electronic Engineering

Cite this

Campbell, E. D., Morales, A. W., & Agili, S. S. (2010). A simple method for restoring passivity in S-parameters using singular value decomposition. In ICCE 2010 - 2010 Digest of Technical Papers International Conference on Consumer Electronics (pp. 219-220). [5418695] https://doi.org/10.1109/ICCE.2010.5418695
Campbell, E. Douglas ; Morales, Aldo W. ; Agili, Sedig Salem. / A simple method for restoring passivity in S-parameters using singular value decomposition. ICCE 2010 - 2010 Digest of Technical Papers International Conference on Consumer Electronics. 2010. pp. 219-220
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Campbell, ED, Morales, AW & Agili, SS 2010, A simple method for restoring passivity in S-parameters using singular value decomposition. in ICCE 2010 - 2010 Digest of Technical Papers International Conference on Consumer Electronics., 5418695, pp. 219-220, 2010 International Conference on Consumer Electronics, ICCE 2010, Las Vegas, NV, United States, 1/11/10. https://doi.org/10.1109/ICCE.2010.5418695

A simple method for restoring passivity in S-parameters using singular value decomposition. / Campbell, E. Douglas; Morales, Aldo W.; Agili, Sedig Salem.

ICCE 2010 - 2010 Digest of Technical Papers International Conference on Consumer Electronics. 2010. p. 219-220 5418695.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

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Campbell ED, Morales AW, Agili SS. A simple method for restoring passivity in S-parameters using singular value decomposition. In ICCE 2010 - 2010 Digest of Technical Papers International Conference on Consumer Electronics. 2010. p. 219-220. 5418695 https://doi.org/10.1109/ICCE.2010.5418695