A simple reflectance method for estimation of the Al mole fraction of bulk AlGaN and AlGaN/GaN heterostructures

L. S. Yu, D. Qiao, S. S. Lau, Joan Marie Redwing

Research output: Contribution to journalArticle

13 Scopus citations

Abstract

In this study, we report a simple optical reflectance method to characterize the Al mole fraction in bulk AlGaN and AlGaN/GaN heterostructures. This method is based on the concept of Fabry-Perot oscillations of a probing beam when the photon energy of the beam falls below the band-gap energy of the semiconductor. The accuracy and merits of this method in comparison with the more elaborate photoluminescence method are discussed.

Original languageEnglish (US)
Pages (from-to)1419-1421
Number of pages3
JournalApplied Physics Letters
Volume75
Issue number10
DOIs
StatePublished - Sep 6 1999

All Science Journal Classification (ASJC) codes

  • Physics and Astronomy (miscellaneous)

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