Abstract
This paper describes a simple instrument for measuring very small electric field-induced strains. A single-beam interferometer with the capability of resolving 10-4 Å or better in the displacement over a frequency range of 3-20 kHz is developed for measuring the direct electrostrictive coefficient of low-permittivity dielectrics. Problems associated with the measurement include mechanical and acoustical vibrations, the sample holder, significant disturbances from the vibration of electrical wires, and deleterious effects associated with high electric field. Procedures designed to eliminate or minimize these problems were developed by modifying the electrical wiring schemes and lowering the applied fields.
| Original language | English (US) |
|---|---|
| Pages (from-to) | 766-772 |
| Number of pages | 7 |
| Journal | Measurement Science and Technology |
| Volume | 14 |
| Issue number | 6 |
| DOIs | |
| State | Published - Jan 1 2003 |
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All Science Journal Classification (ASJC) codes
- Instrumentation
- Engineering (miscellaneous)
- Applied Mathematics
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A single-beam interferometer with sub-ångström displacement resolution for electrostriction measurements. / Yimnirun, R.; Moses, P. J.; Meyer, Jr., Richard Joseph; Newnham, R. E.
In: Measurement Science and Technology, Vol. 14, No. 6, 01.01.2003, p. 766-772.Research output: Contribution to journal › Article
TY - JOUR
T1 - A single-beam interferometer with sub-ångström displacement resolution for electrostriction measurements
AU - Yimnirun, R.
AU - Moses, P. J.
AU - Meyer, Jr., Richard Joseph
AU - Newnham, R. E.
PY - 2003/1/1
Y1 - 2003/1/1
N2 - This paper describes a simple instrument for measuring very small electric field-induced strains. A single-beam interferometer with the capability of resolving 10-4 Å or better in the displacement over a frequency range of 3-20 kHz is developed for measuring the direct electrostrictive coefficient of low-permittivity dielectrics. Problems associated with the measurement include mechanical and acoustical vibrations, the sample holder, significant disturbances from the vibration of electrical wires, and deleterious effects associated with high electric field. Procedures designed to eliminate or minimize these problems were developed by modifying the electrical wiring schemes and lowering the applied fields.
AB - This paper describes a simple instrument for measuring very small electric field-induced strains. A single-beam interferometer with the capability of resolving 10-4 Å or better in the displacement over a frequency range of 3-20 kHz is developed for measuring the direct electrostrictive coefficient of low-permittivity dielectrics. Problems associated with the measurement include mechanical and acoustical vibrations, the sample holder, significant disturbances from the vibration of electrical wires, and deleterious effects associated with high electric field. Procedures designed to eliminate or minimize these problems were developed by modifying the electrical wiring schemes and lowering the applied fields.
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UR - http://www.scopus.com/inward/citedby.url?scp=0038417230&partnerID=8YFLogxK
U2 - 10.1088/0957-0233/14/6/309
DO - 10.1088/0957-0233/14/6/309
M3 - Article
AN - SCOPUS:0038417230
VL - 14
SP - 766
EP - 772
JO - Measurement Science and Technology
JF - Measurement Science and Technology
SN - 0957-0233
IS - 6
ER -