A single-beam interferometer with sub-ångström displacement resolution for electrostriction measurements

R. Yimnirun, P. J. Moses, Richard Joseph Meyer, Jr., R. E. Newnham

Research output: Contribution to journalArticle

9 Citations (Scopus)

Abstract

This paper describes a simple instrument for measuring very small electric field-induced strains. A single-beam interferometer with the capability of resolving 10-4 Å or better in the displacement over a frequency range of 3-20 kHz is developed for measuring the direct electrostrictive coefficient of low-permittivity dielectrics. Problems associated with the measurement include mechanical and acoustical vibrations, the sample holder, significant disturbances from the vibration of electrical wires, and deleterious effects associated with high electric field. Procedures designed to eliminate or minimize these problems were developed by modifying the electrical wiring schemes and lowering the applied fields.

Original languageEnglish (US)
Pages (from-to)766-772
Number of pages7
JournalMeasurement Science and Technology
Volume14
Issue number6
DOIs
StatePublished - Jan 1 2003

Fingerprint

Electrostriction
electrostriction
Interferometer
Interferometers
Electric Field
interferometers
Vibration
Electric fields
mechanical measurement
vibration
wiring
electric fields
Permittivity
Electric wiring
holders
disturbances
Eliminate
Disturbance
frequency ranges
wire

All Science Journal Classification (ASJC) codes

  • Instrumentation
  • Engineering (miscellaneous)
  • Applied Mathematics

Cite this

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A single-beam interferometer with sub-ångström displacement resolution for electrostriction measurements. / Yimnirun, R.; Moses, P. J.; Meyer, Jr., Richard Joseph; Newnham, R. E.

In: Measurement Science and Technology, Vol. 14, No. 6, 01.01.2003, p. 766-772.

Research output: Contribution to journalArticle

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