Multilayers with a sequence of YBa2Cu3O7/PrBa2Cu3O7/YBa2Cu3O7 have been sputtered epitaxially on  SrTiO3 substrates. The heterostructures of these samples have been characterized by high-resolution electron microscopy, Rutherford backscattering and energy-dispersive X-ray analysis. The results indicate a correlation between the substrate quality and the microstructure of the thin films. Substrates with low defect density, a very smooth surface, and good orientation favour the epitaxial growth of all three layers. The chemical composition across the interface changes within the dimension of one unit cell.
All Science Journal Classification (ASJC) codes
- Electronic, Optical and Magnetic Materials
- Condensed Matter Physics
- Energy Engineering and Power Technology
- Electrical and Electronic Engineering