A symbolic dynamics approach for early detection of slowly evolving faults in nonlinear systems

Venkatesh Rajagopalan, Rohan Samsi, Asok Ray, Jeffrey Mayer, Constantino Manuel Lagoa

Research output: Chapter in Book/Report/Conference proceedingConference contribution

1 Scopus citations

Abstract

This paper deals with the early detection of small parameter variations in non-linear systems. The objective is to detect these variations, before they manifest themselves as a sudden change in the phase behavior. It is assumed that these parameter variations occur slowly in time. Early detection of slow time-scale anomalous behavior in nonlinear dynamical system is achieved by observing and inferring time series data of the state or output variables, at the fast time-scale. The detection algorithm makes use of Symbolic Dynamics and Finite State Automata. As an example, we consider the Duffing equation which is a second order non-linear differential equation. The methodology is validated both in simulation and experiment. This concept can be further extended to dynamical systems of higher complexity.

Original languageEnglish (US)
Title of host publicationProceedings of the IASTED International Conference on Circuits, Signals, and Systems
EditorsM.H. Rashid
Pages213-218
Number of pages6
StatePublished - Dec 1 2004
EventProceedings of the IASTED International Conference on Circuits, Signals, and Systems - Clearwater Beach, FL, United States
Duration: Nov 28 2004Dec 1 2004

Publication series

NameProceedings of the IASTED International Conference on Circuits, Signals, and Systems

Other

OtherProceedings of the IASTED International Conference on Circuits, Signals, and Systems
CountryUnited States
CityClearwater Beach, FL
Period11/28/0412/1/04

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All Science Journal Classification (ASJC) codes

  • Engineering(all)

Cite this

Rajagopalan, V., Samsi, R., Ray, A., Mayer, J., & Lagoa, C. M. (2004). A symbolic dynamics approach for early detection of slowly evolving faults in nonlinear systems. In M. H. Rashid (Ed.), Proceedings of the IASTED International Conference on Circuits, Signals, and Systems (pp. 213-218). [449-082] (Proceedings of the IASTED International Conference on Circuits, Signals, and Systems).