A TEM study of Bi2Sr2CaCu2Ox superconducting thin films on SrTiO3 substrates

X. F. Zhang, Bernd C. Kabius, K. Urban, P. Schmitt, L. Schultz, G. Saemann-Ischenko

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Abstract

As-deposited Bi2Sr2CaCu2Ox films on (001) SrTiO3 substrates produced by laser deposition are investigated in a high-resolution electron microscope. The films are well-oriented with the crystallographic c-axis and a-axis direction of the films parallel to the [001] and [110] direction of the substrate, respectively. The substrate/film interface is sharp and good crystalline order is build up from the interface. Misfit dislocations were found inside the film nearby the interface. Planar defects occur in the films. In particular, 90°-rotation twins are found with the rotation axis parallel to the c-axis. The growth mechanism of the films and the effect of the lattice defects on flux pinning is discussed.

Original languageEnglish (US)
Pages (from-to)379-387
Number of pages9
JournalPhysica C: Superconductivity and its Applications
Volume183
Issue number4-6
DOIs
StatePublished - Nov 20 1991

All Science Journal Classification (ASJC) codes

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Energy Engineering and Power Technology
  • Electrical and Electronic Engineering

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    Zhang, X. F., Kabius, B. C., Urban, K., Schmitt, P., Schultz, L., & Saemann-Ischenko, G. (1991). A TEM study of Bi2Sr2CaCu2Ox superconducting thin films on SrTiO3 substrates. Physica C: Superconductivity and its Applications, 183(4-6), 379-387. https://doi.org/10.1016/0921-4534(91)90586-N