### Abstract

This article describes a way to distinguish between two distinct components of light source–induced color shifts, base color shift and metameric color shift, to provide a more complete understanding of color rendition. Working within the existing framework of IES TM-30-18 and CIE 224:2017, it shows that base color shift varies smoothly with location in color space in a pattern that is determined by the spectral power distribution (SPD) of the light source. Patterns of smooth variation can often be approximated well with a low-order polynomial function. Here, a vector field model is presented, based on a second-order polynomial function. The polynomial coefficients are adjusted, for a given light source, to provide a least squares fit to the calculated color shifts of a standard set of color samples. The adequacy of this model was verified by comparing it to another approach for characterizing base color shift that is based on discretization of color space and a much larger set of color samples. Once the vector field model of base color shifts for a given light source is determined, the metameric color shifts can be calculated from the residuals and the distribution of those shifts can be statistically summarized. Based on this information, a metameric uncertainty index (R_{t}) is proposed to provide new information about a light source. In particular, it can be used to estimate the likelihood of noticeable metameric mismatches induced by a given light source, which could lead to improved predictions of the perceived color quality of light.

Original language | English (US) |
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Journal | LEUKOS - Journal of Illuminating Engineering Society of North America |

DOIs | |

State | Published - Jan 1 2019 |

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### All Science Journal Classification (ASJC) codes

- Atomic and Molecular Physics, and Optics

### Cite this

*LEUKOS - Journal of Illuminating Engineering Society of North America*. https://doi.org/10.1080/15502724.2018.1554369

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*LEUKOS - Journal of Illuminating Engineering Society of North America*. https://doi.org/10.1080/15502724.2018.1554369

**A Vector Field Color Rendition Model for Characterizing Color Shifts and Metameric Mismatch.** / David, Aurelien; Esposito, Tony; Houser, Kevin William; Royer, Michael; Smet, Kevin A.G.; Whitehead, Lorne.

Research output: Contribution to journal › Article

TY - JOUR

T1 - A Vector Field Color Rendition Model for Characterizing Color Shifts and Metameric Mismatch

AU - David, Aurelien

AU - Esposito, Tony

AU - Houser, Kevin William

AU - Royer, Michael

AU - Smet, Kevin A.G.

AU - Whitehead, Lorne

PY - 2019/1/1

Y1 - 2019/1/1

N2 - This article describes a way to distinguish between two distinct components of light source–induced color shifts, base color shift and metameric color shift, to provide a more complete understanding of color rendition. Working within the existing framework of IES TM-30-18 and CIE 224:2017, it shows that base color shift varies smoothly with location in color space in a pattern that is determined by the spectral power distribution (SPD) of the light source. Patterns of smooth variation can often be approximated well with a low-order polynomial function. Here, a vector field model is presented, based on a second-order polynomial function. The polynomial coefficients are adjusted, for a given light source, to provide a least squares fit to the calculated color shifts of a standard set of color samples. The adequacy of this model was verified by comparing it to another approach for characterizing base color shift that is based on discretization of color space and a much larger set of color samples. Once the vector field model of base color shifts for a given light source is determined, the metameric color shifts can be calculated from the residuals and the distribution of those shifts can be statistically summarized. Based on this information, a metameric uncertainty index (Rt) is proposed to provide new information about a light source. In particular, it can be used to estimate the likelihood of noticeable metameric mismatches induced by a given light source, which could lead to improved predictions of the perceived color quality of light.

AB - This article describes a way to distinguish between two distinct components of light source–induced color shifts, base color shift and metameric color shift, to provide a more complete understanding of color rendition. Working within the existing framework of IES TM-30-18 and CIE 224:2017, it shows that base color shift varies smoothly with location in color space in a pattern that is determined by the spectral power distribution (SPD) of the light source. Patterns of smooth variation can often be approximated well with a low-order polynomial function. Here, a vector field model is presented, based on a second-order polynomial function. The polynomial coefficients are adjusted, for a given light source, to provide a least squares fit to the calculated color shifts of a standard set of color samples. The adequacy of this model was verified by comparing it to another approach for characterizing base color shift that is based on discretization of color space and a much larger set of color samples. Once the vector field model of base color shifts for a given light source is determined, the metameric color shifts can be calculated from the residuals and the distribution of those shifts can be statistically summarized. Based on this information, a metameric uncertainty index (Rt) is proposed to provide new information about a light source. In particular, it can be used to estimate the likelihood of noticeable metameric mismatches induced by a given light source, which could lead to improved predictions of the perceived color quality of light.

UR - http://www.scopus.com/inward/record.url?scp=85060948156&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=85060948156&partnerID=8YFLogxK

U2 - 10.1080/15502724.2018.1554369

DO - 10.1080/15502724.2018.1554369

M3 - Article

AN - SCOPUS:85060948156

JO - LEUKOS - Journal of Illuminating Engineering Society of North America

JF - LEUKOS - Journal of Illuminating Engineering Society of North America

SN - 1550-2724

ER -