Aberration correction for analytical in situ TEM - The NTEAM concept

Bernd C. Kabius, C. W. Allen, D. J. Miller

Research output: Contribution to journalArticle

4 Scopus citations
Original languageEnglish (US)
Pages (from-to)418-419
Number of pages2
JournalMicroscopy and Microanalysis
Volume8
Issue numberSUPPL. 2
Publication statusPublished - Nov 20 2002

All Science Journal Classification (ASJC) codes

  • Instrumentation

Cite this

Kabius, B. C., Allen, C. W., & Miller, D. J. (2002). Aberration correction for analytical in situ TEM - The NTEAM concept. Microscopy and Microanalysis, 8(SUPPL. 2), 418-419.