Achieving single domain relaxor-PT crystals by high temperature poling

Fei Li; Linghang Wang; Li Jin; Zhuo Xu; Shujun Zhang

doi:10.1039/c3ce42330a

Achieving single domain relaxor-PT crystals by high temperature poling

Fei Li, Linghang Wang, Li Jin, Zhuo Xu, Shujun Zhang

Materials Research Institute (MRI)

Research output: Contribution to journal › Article › peer-review

40 Scopus citations

Abstract

Single domain relaxor-PT crystals are important from both fundamental and application viewpoints. Compared to domain engineered relaxor-PT crystals, however, single domain crystals are prone to cracking during poling. In this paper, based on the analysis of the cracking phenomenon in [001] poled tetragonal 0.25Pb(In_0.5Nb_0.5)O₃-0.37Pb(Mg _1/3Nb_2/3)O₃-0.38PbTiO₃ (PIN-PMN-PT) crystals, the non-180°ferroelastic domain switching was thought to be the dominant factor for cracking during the poling process. A high temperature poling technique, by which the domain switching can be greatly avoided, was proposed to achieve the single domain relaxor-PT crystals. By this poling approach, a quasi-single domain crystal was obtained without cracks. In addition, compared to room temperature poling, the high temperature poled PIN-PMN-PT crystals showed improved electromechanical properties, i.e., a low dielectric loss, a low strain-electric field hysteresis and a high mechanical quality factor, demonstrating a beneficial poling approach. This journal is

Original language	English (US)
Pages (from-to)	2892-2897
Number of pages	6
Journal	CrystEngComm
Volume	16
Issue number	14
DOIs	https://doi.org/10.1039/c3ce42330a
State	Published - Apr 14 2014

All Science Journal Classification (ASJC) codes

Chemistry(all)
Materials Science(all)
Condensed Matter Physics

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title = "Achieving single domain relaxor-PT crystals by high temperature poling",

abstract = "Single domain relaxor-PT crystals are important from both fundamental and application viewpoints. Compared to domain engineered relaxor-PT crystals, however, single domain crystals are prone to cracking during poling. In this paper, based on the analysis of the cracking phenomenon in [001] poled tetragonal 0.25Pb(In0.5Nb0.5)O3-0.37Pb(Mg 1/3Nb2/3)O3-0.38PbTiO3 (PIN-PMN-PT) crystals, the non-180°ferroelastic domain switching was thought to be the dominant factor for cracking during the poling process. A high temperature poling technique, by which the domain switching can be greatly avoided, was proposed to achieve the single domain relaxor-PT crystals. By this poling approach, a quasi-single domain crystal was obtained without cracks. In addition, compared to room temperature poling, the high temperature poled PIN-PMN-PT crystals showed improved electromechanical properties, i.e., a low dielectric loss, a low strain-electric field hysteresis and a high mechanical quality factor, demonstrating a beneficial poling approach. This journal is",

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AU - Li, Fei

AU - Wang, Linghang

AU - Jin, Li

AU - Xu, Zhuo

AU - Zhang, Shujun

PY - 2014/4/14

Y1 - 2014/4/14

N2 - Single domain relaxor-PT crystals are important from both fundamental and application viewpoints. Compared to domain engineered relaxor-PT crystals, however, single domain crystals are prone to cracking during poling. In this paper, based on the analysis of the cracking phenomenon in [001] poled tetragonal 0.25Pb(In0.5Nb0.5)O3-0.37Pb(Mg 1/3Nb2/3)O3-0.38PbTiO3 (PIN-PMN-PT) crystals, the non-180°ferroelastic domain switching was thought to be the dominant factor for cracking during the poling process. A high temperature poling technique, by which the domain switching can be greatly avoided, was proposed to achieve the single domain relaxor-PT crystals. By this poling approach, a quasi-single domain crystal was obtained without cracks. In addition, compared to room temperature poling, the high temperature poled PIN-PMN-PT crystals showed improved electromechanical properties, i.e., a low dielectric loss, a low strain-electric field hysteresis and a high mechanical quality factor, demonstrating a beneficial poling approach. This journal is

AB - Single domain relaxor-PT crystals are important from both fundamental and application viewpoints. Compared to domain engineered relaxor-PT crystals, however, single domain crystals are prone to cracking during poling. In this paper, based on the analysis of the cracking phenomenon in [001] poled tetragonal 0.25Pb(In0.5Nb0.5)O3-0.37Pb(Mg 1/3Nb2/3)O3-0.38PbTiO3 (PIN-PMN-PT) crystals, the non-180°ferroelastic domain switching was thought to be the dominant factor for cracking during the poling process. A high temperature poling technique, by which the domain switching can be greatly avoided, was proposed to achieve the single domain relaxor-PT crystals. By this poling approach, a quasi-single domain crystal was obtained without cracks. In addition, compared to room temperature poling, the high temperature poled PIN-PMN-PT crystals showed improved electromechanical properties, i.e., a low dielectric loss, a low strain-electric field hysteresis and a high mechanical quality factor, demonstrating a beneficial poling approach. This journal is

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Achieving single domain relaxor-PT crystals by high temperature poling

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