ACIS UV/optical blocking filter calibration at the Natl. Synchrotron Light Source

George Chartas, Gordon P. Garmire, John Andrew Nousek, Leisa K. Townsley, Forbes R. Powell, Richard L. Blake, Dale E. Graessle

Research output: Chapter in Book/Report/Conference proceedingConference contribution

4 Citations (Scopus)

Abstract

Measurements of the transmission properties of the AXAF CCD imaging spectrometer (ACIS) UV/optical blocking filters were performed at the National Synchrotron Light Source at Brookhaven Laboratories. The X-ray transmissions of two Al:Si/LEXAN/Al:Si three layer filters were measured between 260 and 3000 eV. The main purpose of the calibration was to determine a model transmission function with an accuracy of better than 1 percent. We present results from fits of model transmission functions to the measured x-ray transmission data. Detailed fine energy scans above the Al-K and C-K absorption edges revealed the presence of fine oscillations of the x-ray transmission. These features are most likely extended x-ray absorption fine structures (EXAFS). The amplitude of the EXAFS oscillations above the Al absorption edge is about 5 percent of the mean value of the x-ray transmission. EXAFS theory predicts a temperature dependence on the amplitude of the EXAFS oscillations. This dependence arises from the fact that thermal vibrations of the atoms in a solid produce a phase mismatch of the backscattered electron wave function. Since the ACIS filters will be at a much lower temperature on orbit we provide a prediction of the EXAFS component for the expected on orbit temperature of the ACIS filters.

Original languageEnglish (US)
Title of host publicationProceedings of SPIE - The International Society for Optical Engineering
EditorsRichard B. Hoover, Arthur B.Jr. Walker
Pages44-54
Number of pages11
Volume2805
StatePublished - 1996
EventMultilayer and Grazing Incidence X-Ray/EUV Optics III - Denver, CO, USA
Duration: Aug 5 1996Aug 6 1996

Other

OtherMultilayer and Grazing Incidence X-Ray/EUV Optics III
CityDenver, CO, USA
Period8/5/968/6/96

Fingerprint

Ultraviolet spectrometers
Synchrotrons
Charge coupled devices
Light sources
Calibration
Imaging techniques
X rays
Wave transmission
Spectrometers
Orbits
Wave functions
Data communication systems
Temperature

All Science Journal Classification (ASJC) codes

  • Engineering(all)

Cite this

Chartas, G., Garmire, G. P., Nousek, J. A., Townsley, L. K., Powell, F. R., Blake, R. L., & Graessle, D. E. (1996). ACIS UV/optical blocking filter calibration at the Natl. Synchrotron Light Source. In R. B. Hoover, & A. B. J. Walker (Eds.), Proceedings of SPIE - The International Society for Optical Engineering (Vol. 2805, pp. 44-54)
Chartas, George ; Garmire, Gordon P. ; Nousek, John Andrew ; Townsley, Leisa K. ; Powell, Forbes R. ; Blake, Richard L. ; Graessle, Dale E. / ACIS UV/optical blocking filter calibration at the Natl. Synchrotron Light Source. Proceedings of SPIE - The International Society for Optical Engineering. editor / Richard B. Hoover ; Arthur B.Jr. Walker. Vol. 2805 1996. pp. 44-54
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abstract = "Measurements of the transmission properties of the AXAF CCD imaging spectrometer (ACIS) UV/optical blocking filters were performed at the National Synchrotron Light Source at Brookhaven Laboratories. The X-ray transmissions of two Al:Si/LEXAN/Al:Si three layer filters were measured between 260 and 3000 eV. The main purpose of the calibration was to determine a model transmission function with an accuracy of better than 1 percent. We present results from fits of model transmission functions to the measured x-ray transmission data. Detailed fine energy scans above the Al-K and C-K absorption edges revealed the presence of fine oscillations of the x-ray transmission. These features are most likely extended x-ray absorption fine structures (EXAFS). The amplitude of the EXAFS oscillations above the Al absorption edge is about 5 percent of the mean value of the x-ray transmission. EXAFS theory predicts a temperature dependence on the amplitude of the EXAFS oscillations. This dependence arises from the fact that thermal vibrations of the atoms in a solid produce a phase mismatch of the backscattered electron wave function. Since the ACIS filters will be at a much lower temperature on orbit we provide a prediction of the EXAFS component for the expected on orbit temperature of the ACIS filters.",
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Chartas, G, Garmire, GP, Nousek, JA, Townsley, LK, Powell, FR, Blake, RL & Graessle, DE 1996, ACIS UV/optical blocking filter calibration at the Natl. Synchrotron Light Source. in RB Hoover & ABJ Walker (eds), Proceedings of SPIE - The International Society for Optical Engineering. vol. 2805, pp. 44-54, Multilayer and Grazing Incidence X-Ray/EUV Optics III, Denver, CO, USA, 8/5/96.

ACIS UV/optical blocking filter calibration at the Natl. Synchrotron Light Source. / Chartas, George; Garmire, Gordon P.; Nousek, John Andrew; Townsley, Leisa K.; Powell, Forbes R.; Blake, Richard L.; Graessle, Dale E.

Proceedings of SPIE - The International Society for Optical Engineering. ed. / Richard B. Hoover; Arthur B.Jr. Walker. Vol. 2805 1996. p. 44-54.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

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AU - Chartas, George

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N2 - Measurements of the transmission properties of the AXAF CCD imaging spectrometer (ACIS) UV/optical blocking filters were performed at the National Synchrotron Light Source at Brookhaven Laboratories. The X-ray transmissions of two Al:Si/LEXAN/Al:Si three layer filters were measured between 260 and 3000 eV. The main purpose of the calibration was to determine a model transmission function with an accuracy of better than 1 percent. We present results from fits of model transmission functions to the measured x-ray transmission data. Detailed fine energy scans above the Al-K and C-K absorption edges revealed the presence of fine oscillations of the x-ray transmission. These features are most likely extended x-ray absorption fine structures (EXAFS). The amplitude of the EXAFS oscillations above the Al absorption edge is about 5 percent of the mean value of the x-ray transmission. EXAFS theory predicts a temperature dependence on the amplitude of the EXAFS oscillations. This dependence arises from the fact that thermal vibrations of the atoms in a solid produce a phase mismatch of the backscattered electron wave function. Since the ACIS filters will be at a much lower temperature on orbit we provide a prediction of the EXAFS component for the expected on orbit temperature of the ACIS filters.

AB - Measurements of the transmission properties of the AXAF CCD imaging spectrometer (ACIS) UV/optical blocking filters were performed at the National Synchrotron Light Source at Brookhaven Laboratories. The X-ray transmissions of two Al:Si/LEXAN/Al:Si three layer filters were measured between 260 and 3000 eV. The main purpose of the calibration was to determine a model transmission function with an accuracy of better than 1 percent. We present results from fits of model transmission functions to the measured x-ray transmission data. Detailed fine energy scans above the Al-K and C-K absorption edges revealed the presence of fine oscillations of the x-ray transmission. These features are most likely extended x-ray absorption fine structures (EXAFS). The amplitude of the EXAFS oscillations above the Al absorption edge is about 5 percent of the mean value of the x-ray transmission. EXAFS theory predicts a temperature dependence on the amplitude of the EXAFS oscillations. This dependence arises from the fact that thermal vibrations of the atoms in a solid produce a phase mismatch of the backscattered electron wave function. Since the ACIS filters will be at a much lower temperature on orbit we provide a prediction of the EXAFS component for the expected on orbit temperature of the ACIS filters.

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M3 - Conference contribution

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BT - Proceedings of SPIE - The International Society for Optical Engineering

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Chartas G, Garmire GP, Nousek JA, Townsley LK, Powell FR, Blake RL et al. ACIS UV/optical blocking filter calibration at the Natl. Synchrotron Light Source. In Hoover RB, Walker ABJ, editors, Proceedings of SPIE - The International Society for Optical Engineering. Vol. 2805. 1996. p. 44-54