Activity clustering for leakage management in SPMs

M. Kandemir, G. Chen, F. Li, M. J. Irwin, I. Kolcu

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

This paper we proposes compiler-based leakage optimization strategy for on-chip scratch-pad memories (SPMs). The idea is to keep only a small set of SPM regions active at a given time and pre-activate SPM regions based on the compiler-extracted data access pattern. Our strategy, called activity clustering, increases the length of the idle periods of SPM regions by clustering accesses to a small set of regions at a time. It thus allows an SPM to take better advantage of the underlying leakage optimization mechanism.

Original languageEnglish (US)
Title of host publicationProceedings - Design, Automation and Test in Europe, DATE'06
StatePublished - Dec 1 2006
EventDesign, Automation and Test in Europe, DATE'06 - Munich, Germany
Duration: Mar 6 2006Mar 10 2006

Publication series

NameProceedings -Design, Automation and Test in Europe, DATE
Volume1
ISSN (Print)1530-1591

Other

OtherDesign, Automation and Test in Europe, DATE'06
CountryGermany
CityMunich
Period3/6/063/10/06

All Science Journal Classification (ASJC) codes

  • Engineering(all)

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  • Cite this

    Kandemir, M., Chen, G., Li, F., Irwin, M. J., & Kolcu, I. (2006). Activity clustering for leakage management in SPMs. In Proceedings - Design, Automation and Test in Europe, DATE'06 [1656976] (Proceedings -Design, Automation and Test in Europe, DATE; Vol. 1).