An ILP formulation for reliability-oriented high-level synthesis

S. Tosun, O. Ozturk, N. Mansouri, E. Arvas, M. Kandemir, Y. Xie, W. L. Hung

Research output: Chapter in Book/Report/Conference proceedingConference contribution

23 Scopus citations

Abstract

Reliability decisions taken early in system design can bring significant benefits in terms of design quality. This paper presents a 0-1 integer linear programming (ILP) formulation for reliability-oriented high-level synthesis that addresses the soft error problem. The proposed approach tries to maximize reliability of the design while observing the bounds on area and performance, and makes use of our reliability characterization of hardware components such as adders and multipliers. We implemented the proposed approach, performed experiments with several example designs, and compared the results with those obtained by a prior proposal. Our results show that incorporating reliability as a first-class metric during high-level synthesis brings significant improvements on the overall design reliability.

Original languageEnglish (US)
Title of host publicationProceedings - 6th International Symposium on Quality Electronic Design, ISQED 2005
Pages364-369
Number of pages6
DOIs
StatePublished - Dec 1 2005
Event6th International Symposium on Quality Electronic Design, ISQED 2005 - San Jose, CA, United States
Duration: Mar 21 2005Mar 23 2005

Publication series

NameProceedings - International Symposium on Quality Electronic Design, ISQED
ISSN (Print)1948-3287
ISSN (Electronic)1948-3295

Other

Other6th International Symposium on Quality Electronic Design, ISQED 2005
CountryUnited States
CitySan Jose, CA
Period3/21/053/23/05

All Science Journal Classification (ASJC) codes

  • Hardware and Architecture
  • Electrical and Electronic Engineering
  • Safety, Risk, Reliability and Quality

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  • Cite this

    Tosun, S., Ozturk, O., Mansouri, N., Arvas, E., Kandemir, M., Xie, Y., & Hung, W. L. (2005). An ILP formulation for reliability-oriented high-level synthesis. In Proceedings - 6th International Symposium on Quality Electronic Design, ISQED 2005 (pp. 364-369). [1410610] (Proceedings - International Symposium on Quality Electronic Design, ISQED). https://doi.org/10.1109/ISQED.2005.15