An STM study of Cu on Si(001) in the c(8 × 8) structure

B. Z. Liu, M. V. Katkov, J. Nogami

Research output: Contribution to journalArticlepeer-review

10 Scopus citations

Abstract

We have studied the growth of Cu on the Si(001) surface over a range of growth temperatures and metal coverages. The only ordered phase seen by low energy electron diffraction (LEED), other than the 2 × 1 substrate pattern, was a c(8 × 8) phase which occurs at coverages as low as 0.05 monolayers. Scanning tunneling microscopy (STM) measurements show that the c(8 × 8) structure consists of an array of bright features, two per unit cell. We propose one possible atomic structure on the basis of the STM images.

Original languageEnglish (US)
Pages (from-to)137-142
Number of pages6
JournalSurface Science
Volume453
Issue number1-3
DOIs
StatePublished - May 10 2000

All Science Journal Classification (ASJC) codes

  • Condensed Matter Physics
  • Surfaces and Interfaces
  • Surfaces, Coatings and Films
  • Materials Chemistry

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