Analysis of compositionally and structurally graded Si:H and Si 1-xGe x:H thin films by real time spectroscopic ellipsometry

Nikolas J. Podraza, Jing Li, Christopher R. Wronski, Mark W. Horn, Elizabeth C. Dickey, Robert W. Collins

Research output: Chapter in Book/Report/Conference proceedingConference contribution

7 Scopus citations

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Engineering & Materials Science

Chemical Compounds

Physics & Astronomy