Analysis of Damage in Unidirectional CFRP Circuit Analog Absorbers

Joseph C. Ordonnell, Ram Mohan Narayanan, Erik H. Lenzing

Research output: Chapter in Book/Report/Conference proceedingConference contribution

1 Scopus citations

Abstract

This paper explores the effect that various instances and sources of damage have on the reflection coefficient of carbon-fiber reinforced polymer (CFRP) circuit analog absorbers (CAA). To characterize and quantify these changes, five absorbers were constructed for use as radar absorbing materials (RAM). A wet-layup procedure was used to develop the sandwich structure of a single-ply unidirectional CFRP, dielectric slab, and carbon twill weave. The evolution of the reflection coefficient is recorded and presented for four different sources of damage.

Original languageEnglish (US)
Title of host publicationNAECON 2018 - IEEE National Aerospace and Electronics Conference
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages555-560
Number of pages6
ISBN (Electronic)9781538665572
DOIs
StatePublished - Dec 3 2018
Event2018 IEEE National Aerospace and Electronics Conference, NAECON 2018 - Dayton, United States
Duration: Jul 23 2018Jul 26 2018

Publication series

NameProceedings of the IEEE National Aerospace Electronics Conference, NAECON
Volume2018-July
ISSN (Print)0547-3578
ISSN (Electronic)2379-2027

Other

Other2018 IEEE National Aerospace and Electronics Conference, NAECON 2018
CountryUnited States
CityDayton
Period7/23/187/26/18

All Science Journal Classification (ASJC) codes

  • Computer Networks and Communications
  • Computer Science Applications
  • Control and Systems Engineering
  • Electrical and Electronic Engineering

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  • Cite this

    Ordonnell, J. C., Narayanan, R. M., & Lenzing, E. H. (2018). Analysis of Damage in Unidirectional CFRP Circuit Analog Absorbers. In NAECON 2018 - IEEE National Aerospace and Electronics Conference (pp. 555-560). [8556636] (Proceedings of the IEEE National Aerospace Electronics Conference, NAECON; Vol. 2018-July). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/NAECON.2018.8556636