Analysis of Damage in Unidirectional CFRP Circuit Analog Absorbers

Joseph C. Ordonnell, Ram Mohan Narayanan, Erik H. Lenzing

Research output: Chapter in Book/Report/Conference proceedingConference contribution

1 Citation (Scopus)

Abstract

This paper explores the effect that various instances and sources of damage have on the reflection coefficient of carbon-fiber reinforced polymer (CFRP) circuit analog absorbers (CAA). To characterize and quantify these changes, five absorbers were constructed for use as radar absorbing materials (RAM). A wet-layup procedure was used to develop the sandwich structure of a single-ply unidirectional CFRP, dielectric slab, and carbon twill weave. The evolution of the reflection coefficient is recorded and presented for four different sources of damage.

Original languageEnglish (US)
Title of host publicationNAECON 2018 - IEEE National Aerospace and Electronics Conference
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages555-560
Number of pages6
ISBN (Electronic)9781538665572
DOIs
StatePublished - Dec 3 2018
Event2018 IEEE National Aerospace and Electronics Conference, NAECON 2018 - Dayton, United States
Duration: Jul 23 2018Jul 26 2018

Publication series

NameProceedings of the IEEE National Aerospace Electronics Conference, NAECON
Volume2018-July
ISSN (Print)0547-3578
ISSN (Electronic)2379-2027

Other

Other2018 IEEE National Aerospace and Electronics Conference, NAECON 2018
CountryUnited States
CityDayton
Period7/23/187/26/18

Fingerprint

Carbon fibers
Radar absorbing materials
Sandwich structures
Networks (circuits)
Polymers
Carbon

All Science Journal Classification (ASJC) codes

  • Computer Networks and Communications
  • Computer Science Applications
  • Control and Systems Engineering
  • Electrical and Electronic Engineering

Cite this

Ordonnell, J. C., Narayanan, R. M., & Lenzing, E. H. (2018). Analysis of Damage in Unidirectional CFRP Circuit Analog Absorbers. In NAECON 2018 - IEEE National Aerospace and Electronics Conference (pp. 555-560). [8556636] (Proceedings of the IEEE National Aerospace Electronics Conference, NAECON; Vol. 2018-July). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/NAECON.2018.8556636
Ordonnell, Joseph C. ; Narayanan, Ram Mohan ; Lenzing, Erik H. / Analysis of Damage in Unidirectional CFRP Circuit Analog Absorbers. NAECON 2018 - IEEE National Aerospace and Electronics Conference. Institute of Electrical and Electronics Engineers Inc., 2018. pp. 555-560 (Proceedings of the IEEE National Aerospace Electronics Conference, NAECON).
@inproceedings{547fc4d2255a4292ae0baa2615a4643d,
title = "Analysis of Damage in Unidirectional CFRP Circuit Analog Absorbers",
abstract = "This paper explores the effect that various instances and sources of damage have on the reflection coefficient of carbon-fiber reinforced polymer (CFRP) circuit analog absorbers (CAA). To characterize and quantify these changes, five absorbers were constructed for use as radar absorbing materials (RAM). A wet-layup procedure was used to develop the sandwich structure of a single-ply unidirectional CFRP, dielectric slab, and carbon twill weave. The evolution of the reflection coefficient is recorded and presented for four different sources of damage.",
author = "Ordonnell, {Joseph C.} and Narayanan, {Ram Mohan} and Lenzing, {Erik H.}",
year = "2018",
month = "12",
day = "3",
doi = "10.1109/NAECON.2018.8556636",
language = "English (US)",
series = "Proceedings of the IEEE National Aerospace Electronics Conference, NAECON",
publisher = "Institute of Electrical and Electronics Engineers Inc.",
pages = "555--560",
booktitle = "NAECON 2018 - IEEE National Aerospace and Electronics Conference",
address = "United States",

}

Ordonnell, JC, Narayanan, RM & Lenzing, EH 2018, Analysis of Damage in Unidirectional CFRP Circuit Analog Absorbers. in NAECON 2018 - IEEE National Aerospace and Electronics Conference., 8556636, Proceedings of the IEEE National Aerospace Electronics Conference, NAECON, vol. 2018-July, Institute of Electrical and Electronics Engineers Inc., pp. 555-560, 2018 IEEE National Aerospace and Electronics Conference, NAECON 2018, Dayton, United States, 7/23/18. https://doi.org/10.1109/NAECON.2018.8556636

Analysis of Damage in Unidirectional CFRP Circuit Analog Absorbers. / Ordonnell, Joseph C.; Narayanan, Ram Mohan; Lenzing, Erik H.

NAECON 2018 - IEEE National Aerospace and Electronics Conference. Institute of Electrical and Electronics Engineers Inc., 2018. p. 555-560 8556636 (Proceedings of the IEEE National Aerospace Electronics Conference, NAECON; Vol. 2018-July).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

TY - GEN

T1 - Analysis of Damage in Unidirectional CFRP Circuit Analog Absorbers

AU - Ordonnell, Joseph C.

AU - Narayanan, Ram Mohan

AU - Lenzing, Erik H.

PY - 2018/12/3

Y1 - 2018/12/3

N2 - This paper explores the effect that various instances and sources of damage have on the reflection coefficient of carbon-fiber reinforced polymer (CFRP) circuit analog absorbers (CAA). To characterize and quantify these changes, five absorbers were constructed for use as radar absorbing materials (RAM). A wet-layup procedure was used to develop the sandwich structure of a single-ply unidirectional CFRP, dielectric slab, and carbon twill weave. The evolution of the reflection coefficient is recorded and presented for four different sources of damage.

AB - This paper explores the effect that various instances and sources of damage have on the reflection coefficient of carbon-fiber reinforced polymer (CFRP) circuit analog absorbers (CAA). To characterize and quantify these changes, five absorbers were constructed for use as radar absorbing materials (RAM). A wet-layup procedure was used to develop the sandwich structure of a single-ply unidirectional CFRP, dielectric slab, and carbon twill weave. The evolution of the reflection coefficient is recorded and presented for four different sources of damage.

UR - http://www.scopus.com/inward/record.url?scp=85059891960&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=85059891960&partnerID=8YFLogxK

U2 - 10.1109/NAECON.2018.8556636

DO - 10.1109/NAECON.2018.8556636

M3 - Conference contribution

AN - SCOPUS:85059891960

T3 - Proceedings of the IEEE National Aerospace Electronics Conference, NAECON

SP - 555

EP - 560

BT - NAECON 2018 - IEEE National Aerospace and Electronics Conference

PB - Institute of Electrical and Electronics Engineers Inc.

ER -

Ordonnell JC, Narayanan RM, Lenzing EH. Analysis of Damage in Unidirectional CFRP Circuit Analog Absorbers. In NAECON 2018 - IEEE National Aerospace and Electronics Conference. Institute of Electrical and Electronics Engineers Inc. 2018. p. 555-560. 8556636. (Proceedings of the IEEE National Aerospace Electronics Conference, NAECON). https://doi.org/10.1109/NAECON.2018.8556636