Analysis of DIBL Effect and Negative Resistance Performance for NCFET Based on a Compact SPICE Model

Yuhua Liang, Xueqing Li, Sumeet Kumar Gupta, Suman Datta, Vijaykrishnan Narayanan

Research output: Contribution to journalArticle

4 Citations (Scopus)

Abstract

In this paper, we describe an improved SPICE model for the negative capacitance field-effect transistor (NCFET). According to the law of conservation of charge, the model is built based on the relationship between the gate charge of the MOSFET and the charge reserved by the ferroelectric layer and includes the parasitic resistance and capacitance into consideration. Based on the model, the drain-induced barrier lowering (DIBL) and the negative resistance (NR) of the NCFET are analyzed. Finally, taking two well-known analog blocks (the current mirror and the latch comparator) for example, impacts of the DIBL effect and the NR property on analog circuit performances are discussed. Thanks to utilization of the NR feature, not only can impacts of the DIBL effect and the channel-length modulation (CLM) effect be alleviated to improve the mirroring accuracy, but also the comparison speed of the latch comparator be accelerated.

Original languageEnglish (US)
Article number8513804
Pages (from-to)5525-5529
Number of pages5
JournalIEEE Transactions on Electron Devices
Volume65
Issue number12
DOIs
StatePublished - Dec 1 2018

Fingerprint

Negative resistance
SPICE
Field effect transistors
Capacitance
Analog circuits
Ferroelectric materials
Conservation
Mirrors
Modulation

All Science Journal Classification (ASJC) codes

  • Electronic, Optical and Magnetic Materials
  • Electrical and Electronic Engineering

Cite this

Liang, Yuhua ; Li, Xueqing ; Gupta, Sumeet Kumar ; Datta, Suman ; Narayanan, Vijaykrishnan. / Analysis of DIBL Effect and Negative Resistance Performance for NCFET Based on a Compact SPICE Model. In: IEEE Transactions on Electron Devices. 2018 ; Vol. 65, No. 12. pp. 5525-5529.
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Analysis of DIBL Effect and Negative Resistance Performance for NCFET Based on a Compact SPICE Model. / Liang, Yuhua; Li, Xueqing; Gupta, Sumeet Kumar; Datta, Suman; Narayanan, Vijaykrishnan.

In: IEEE Transactions on Electron Devices, Vol. 65, No. 12, 8513804, 01.12.2018, p. 5525-5529.

Research output: Contribution to journalArticle

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