Analysis of electrical properties of post-annealed polycrystalline CaCu3Ti4O12 films by impedance spectroscopy

Liang Fang, Ming Rong Shen, Zhen Ya Li, Wenwu Cao

Research output: Contribution to journalArticle

4 Citations (Scopus)

Abstract

Impedance spectroscopy is performed to establish the electrical property and microstructure relations of the as-deposited and post-annealed polycrystalline CaCu3Ti4O12 (CCTO) films. Our results show that the resistance and capacitance of the grains and grain boundaries could be tuned by changing the annealing atmosphere and temperature. The simple resistor-capacitor equivalent circuit and the modified constant phase element (CPE) circuit are used to describe the impedance spectroscopy, and excellent agreement between the calculated and measured curves is obtained in the CPE circuit. Based on the experimental results, it is suggested that the origin of the semiconductivity of the grains in CCTO polycrystalline films originates from their oxygen-loss, while the grain boundaries are close to oxygen- stoichiometry.

Original languageEnglish (US)
Pages (from-to)990-993
Number of pages4
JournalChinese Physics Letters
Volume23
Issue number4
DOIs
StatePublished - Apr 1 2006

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grain boundaries
electrical properties
impedance
oxygen
equivalent circuits
resistors
spectroscopy
stoichiometry
capacitors
capacitance
atmospheres
microstructure
annealing
curves
temperature

All Science Journal Classification (ASJC) codes

  • Physics and Astronomy(all)

Cite this

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title = "Analysis of electrical properties of post-annealed polycrystalline CaCu3Ti4O12 films by impedance spectroscopy",
abstract = "Impedance spectroscopy is performed to establish the electrical property and microstructure relations of the as-deposited and post-annealed polycrystalline CaCu3Ti4O12 (CCTO) films. Our results show that the resistance and capacitance of the grains and grain boundaries could be tuned by changing the annealing atmosphere and temperature. The simple resistor-capacitor equivalent circuit and the modified constant phase element (CPE) circuit are used to describe the impedance spectroscopy, and excellent agreement between the calculated and measured curves is obtained in the CPE circuit. Based on the experimental results, it is suggested that the origin of the semiconductivity of the grains in CCTO polycrystalline films originates from their oxygen-loss, while the grain boundaries are close to oxygen- stoichiometry.",
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Analysis of electrical properties of post-annealed polycrystalline CaCu3Ti4O12 films by impedance spectroscopy. / Fang, Liang; Shen, Ming Rong; Li, Zhen Ya; Cao, Wenwu.

In: Chinese Physics Letters, Vol. 23, No. 4, 01.04.2006, p. 990-993.

Research output: Contribution to journalArticle

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AB - Impedance spectroscopy is performed to establish the electrical property and microstructure relations of the as-deposited and post-annealed polycrystalline CaCu3Ti4O12 (CCTO) films. Our results show that the resistance and capacitance of the grains and grain boundaries could be tuned by changing the annealing atmosphere and temperature. The simple resistor-capacitor equivalent circuit and the modified constant phase element (CPE) circuit are used to describe the impedance spectroscopy, and excellent agreement between the calculated and measured curves is obtained in the CPE circuit. Based on the experimental results, it is suggested that the origin of the semiconductivity of the grains in CCTO polycrystalline films originates from their oxygen-loss, while the grain boundaries are close to oxygen- stoichiometry.

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