Analysis of liposome model systems by timeofflight secondary ion mass spectrometry

Jelena Lovrić, Jacqueline D. Keighron, Tina B. Angerer, Xianchan Li, Per Malmberg, John S. Fletcher, Andrew G. Ewing

Research output: Contribution to journalArticlepeer-review

Abstract

Time-of-flight secondary ion mass spectrometry (ToF-SIMS) is an important technique for studying chemical composition of micrometer scale objects because of its high spatial resolution imaging capabilities and chemical specificity. In this work, we focus on the application of ToF-SIMS to gain insight into the chemistry of micrometer size liposomes as a potential model for neurotransmitter vesicles. Two models of giant liposomes were analyzed: histamine and aqueous two-phase systemcontaining liposomes. Characterization of the internal structure of single fixed liposomes was carried out both with the Bi3 + and C60 + ion sources. The depth profiling capability of ToF-SIMS was used to investigate the liposome interior.

Original languageEnglish (US)
Pages (from-to)74-78
Number of pages5
JournalSurface and Interface Analysis
Volume46
Issue numberS1
DOIs
StatePublished - Nov 1 2014

All Science Journal Classification (ASJC) codes

  • Chemistry(all)
  • Condensed Matter Physics
  • Surfaces and Interfaces
  • Surfaces, Coatings and Films
  • Materials Chemistry

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