Analysis of random grating period and amplitude errors in ultra-thin long-period grating

Kun Wook Chung, Shizhuo Yin

    Research output: Contribution to journalArticle

    10 Citations (Scopus)

    Abstract

    The effects of random fabrication errors on an ultra-thin long-period grating are numerically investigated. The influences of the random grating period and random amplitude nodes on an optical bandpass filter based on an ultra-thin long-period grating are introduced. It is found that the random period errors present severe degradation of the spectral performance of the ultra-thin long-period grating. The coupling intensity of the ultra-thin long-period grating decays exponentially with even small grating period noises. Our simulation results may help manufacturers to analyze the quality of fabricated long-period gratings and to point out future improvement directions.

    Original languageEnglish (US)
    Pages (from-to)178-181
    Number of pages4
    JournalMicrowave and Optical Technology Letters
    Volume30
    Issue number3
    DOIs
    StatePublished - Aug 5 2001

    Fingerprint

    Random errors
    Optical filters
    Bandpass filters
    gratings
    Fabrication
    Degradation
    Direction compound
    bandpass filters
    degradation
    fabrication
    decay

    All Science Journal Classification (ASJC) codes

    • Electronic, Optical and Magnetic Materials
    • Atomic and Molecular Physics, and Optics
    • Condensed Matter Physics
    • Electrical and Electronic Engineering

    Cite this

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    Analysis of random grating period and amplitude errors in ultra-thin long-period grating. / Chung, Kun Wook; Yin, Shizhuo.

    In: Microwave and Optical Technology Letters, Vol. 30, No. 3, 05.08.2001, p. 178-181.

    Research output: Contribution to journalArticle

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