Analysis of random grating period and amplitude errors in ultra-thin long-period grating

Kun Wook Chung, Shizhuo Yin

Research output: Contribution to journalArticlepeer-review

11 Scopus citations

Abstract

The effects of random fabrication errors on an ultra-thin long-period grating are numerically investigated. The influences of the random grating period and random amplitude nodes on an optical bandpass filter based on an ultra-thin long-period grating are introduced. It is found that the random period errors present severe degradation of the spectral performance of the ultra-thin long-period grating. The coupling intensity of the ultra-thin long-period grating decays exponentially with even small grating period noises. Our simulation results may help manufacturers to analyze the quality of fabricated long-period gratings and to point out future improvement directions.

Original languageEnglish (US)
Pages (from-to)178-181
Number of pages4
JournalMicrowave and Optical Technology Letters
Volume30
Issue number3
DOIs
StatePublished - Aug 5 2001

All Science Journal Classification (ASJC) codes

  • Electronic, Optical and Magnetic Materials
  • Atomic and Molecular Physics, and Optics
  • Condensed Matter Physics
  • Electrical and Electronic Engineering

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