Analysis of silver columnar thin films by atomic force microscopy

Fatima Benkabou, Akhlesh Lakhtakia

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

Analyses of the top-surface morphology of columnar thin films (CTFs) of silver, grown by a combination of the usual oblique-angle-deposition technique with very fast substrate rotation, confirm that silver CTFs consist of more isolated and quasiperiodically distributed nanowires for higher vapor incidence angle during deposition. The top surfaces then are well-suited for the exploitation of surface-enhanced Raman scattering and localized surface-plasmon resonance.

Original languageEnglish (US)
Title of host publicationNanostructured Thin Films
DOIs
StatePublished - Nov 21 2008
EventNanostructured Thin Films - San Diego, CA, United States
Duration: Aug 13 2008Aug 14 2008

Publication series

NameProceedings of SPIE - The International Society for Optical Engineering
Volume7041
ISSN (Print)0277-786X

Other

OtherNanostructured Thin Films
CountryUnited States
CitySan Diego, CA
Period8/13/088/14/08

Fingerprint

Atomic Force Microscopy
Silver
Thin Films
Atomic force microscopy
silver
atomic force microscopy
Localized Surface Plasmon Resonance
Surface-enhanced Raman Scattering
Angle
Thin films
Surface Morphology
Nanowires
Surface plasmon resonance
Oblique
thin films
Exploitation
Surface morphology
Raman scattering
Incidence
Vapors

All Science Journal Classification (ASJC) codes

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Computer Science Applications
  • Applied Mathematics
  • Electrical and Electronic Engineering

Cite this

Benkabou, F., & Lakhtakia, A. (2008). Analysis of silver columnar thin films by atomic force microscopy. In Nanostructured Thin Films [704112] (Proceedings of SPIE - The International Society for Optical Engineering; Vol. 7041). https://doi.org/10.1117/12.796212
Benkabou, Fatima ; Lakhtakia, Akhlesh. / Analysis of silver columnar thin films by atomic force microscopy. Nanostructured Thin Films. 2008. (Proceedings of SPIE - The International Society for Optical Engineering).
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Benkabou, F & Lakhtakia, A 2008, Analysis of silver columnar thin films by atomic force microscopy. in Nanostructured Thin Films., 704112, Proceedings of SPIE - The International Society for Optical Engineering, vol. 7041, Nanostructured Thin Films, San Diego, CA, United States, 8/13/08. https://doi.org/10.1117/12.796212

Analysis of silver columnar thin films by atomic force microscopy. / Benkabou, Fatima; Lakhtakia, Akhlesh.

Nanostructured Thin Films. 2008. 704112 (Proceedings of SPIE - The International Society for Optical Engineering; Vol. 7041).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

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Benkabou F, Lakhtakia A. Analysis of silver columnar thin films by atomic force microscopy. In Nanostructured Thin Films. 2008. 704112. (Proceedings of SPIE - The International Society for Optical Engineering). https://doi.org/10.1117/12.796212